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Conference asdg::cmp

Title:CMP
Notice:Welcome to the CMP notesfile
Moderator:FABSIX::B_TOWERLLE
Created:Tue Oct 31 1995
Last Modified:Fri Jun 06 1997
Last Successful Update:Fri Jun 06 1997
Number of topics:94
Total number of notes:6381

28.0. "CMP.B2 DECTREE USAGE" by SUBPAC::BJUBINVILLE (CMP-6 Equipment Engineering) Sat Dec 14 1996 05:53

    
    
         This note is designated for Process Engineering
      Dectree usage on CMP.B2.
    
                            
T.RTitleUserPersonal
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28.1Generic CMP Decision TreeYIELD::GUI$TREESRVFri Mar 28 1997 10:1977
APPLICATION: cmpgeneric.  (Developed with DECtree V3.0A)
Fri Mar 28 10:10:18 1997

MESSAGE: Welcome to the CMP Generic Fab6 Dectree 
        for SPC failures! You will be asked a 
        series of questions and given suggested 
        general actions to help troubleshoot the 
        failure and provide corrective action.
        
        Use the arrows and return keys to move 
        through the menus, and CTRL-B to backup.
        CTRL-Z quits.

INPUT:
  PROMPT: Was the data mis-entered?
  CHOICE: NO

INPUT:
  PROMPT: Does the SPC chart have the wrong 
          limits or rules turned on?
  CHOICE: NO

INPUT:
  PROMPT: What type of SPC failure happened?
  CHOICE: Other MQCs(Polish Rate/Nonuniformity)

INPUT:
  PROMPT: Is the processing tool due for a PM, 
          clean, pad change, or other routinely 
          scheduled maintenance?
  CHOICE: No

MESSAGE: Repeat MQC after processing 
        additional exercise wafers.
++  BACKUP One Step
MESSAGE: Repeat MQC after processing 
        additional exercise wafers.
++  BACKUP One Step
INPUT:
  PROMPT: Is the processing tool due for a PM, 
          clean, pad change, or other routinely 
          scheduled maintenance?
  CHOICE: No

MESSAGE: Repeat MQC after processing 
        additional exercise wafers.
++  BACKUP One Step
INPUT:
  PROMPT: Is the processing tool due for a PM, 
          clean, pad change, or other routinely 
          scheduled maintenance?
  CHOICE: No

MESSAGE: Repeat MQC after processing 
        additional exercise wafers.
++  BACKUP One Step
MESSAGE: Repeat MQC after processing 
        additional exercise wafers.
++  BACKUP One Step++  BACKUP One Step++  BACKUP One Step++  BACKUP One Step++  BACKUP One Step
MESSAGE: Welcome to the CMP Generic Fab6 Dectree 
        for SPC failures! You will be asked a 
        series of questions and given suggested 
        general actions to help troubleshoot the 
        failure and provide corrective action.
        
        Use the arrows and return keys to move 
        through the menus, and CTRL-B to backup.
        CTRL-Z quits.

INPUT:
  PROMPT: Was the data mis-entered?
  CHOICE: NO

INPUT:
  PROMPT: Does the SPC chart have the wrong 
          limits or rules turned on?
  CHOICE: NO
28.2Generic CMP Decision TreeYIELD::GUI$TREESRVFri Mar 28 1997 10:2197
APPLICATION: cmpgeneric.  (Developed with DECtree V3.0A)
Fri Mar 28 10:12:39 1997

MESSAGE: Welcome to the CMP Generic Fab6 Dectree 
        for SPC failures! You will be asked a 
        series of questions and given suggested 
        general actions to help troubleshoot the 
        failure and provide corrective action.
        
        Use the arrows and return keys to move 
        through the menus, and CTRL-B to backup.
        CTRL-Z quits.

INPUT:
  PROMPT: Was the data mis-entered?
  CHOICE: NO

INPUT:
  PROMPT: Does the SPC chart have the wrong 
          limits or rules turned on?
  CHOICE: NO

INPUT:
  PROMPT: What type of SPC failure happened?
  CHOICE: Product Chart

INPUT:
  PROMPT: Did the lot(s) that flagged have splits
          at this or other operations that could
          affect this SPC entry?
  CHOICE: NO

MESSAGE: Verify that the correct metrology recipe was
        used to measure the lot.

INPUT:
  PROMPT: Was the wrong measurement recipe used?
  CHOICE: NO

INPUT:
  PROMPT: Were there Pre and POST readings done
          on this lot?
  CHOICE: YES

INPUT:
  PROMPT: Were the pre readings typical for this
          device?
  CHOICE: YES

INPUT:
  PROMPT: Does the measurement program read the
          wafer in the correct spot?
  CHOICE: YES

MESSAGE: Run SPC and look up the spc chart
        that failed. Check to see if any other
        lots failed the same SPC chart on the 
        same processing tool in the last 3 days
        or if the process is trending.

INPUT:
  PROMPT: Is there a process trend for this
          device on this processing tool?
  CHOICE: NO

MESSAGE: Check the MQC SPC charts for the processing
        tool.  Verify that MQC's were run and are in spec.

INPUT:
  PROMPT: Are MQC's out of spec or showing a trend
          on this tool?
  CHOICE: NO

MESSAGE: Check that the wafers have the 
        correct lot number, are at the correct
        workstream operation, and were run on 
        the correct process recipe. 

INPUT:
  PROMPT: Was the correct lot run, at the correct  operation,
          with the correct processing recipe?
  CHOICE: YES

INPUT:
  PROMPT: Does the process recipe agree with the spec?
  CHOICE: YES

INPUT:
  PROMPT: Were the correct number of warmup wafers
          or pilot wafers or conditioning done before
          processing the lot?
          
  CHOICE: YES

MESSAGE: Contact PSS to disposition lot.

MESSAGE: End of Session.