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Conference asdg::cmp

Title:CMP
Notice:Welcome to the CMP notesfile
Moderator:FABSIX::B_TOWERLLE
Created:Tue Oct 31 1995
Last Modified:Fri Jun 06 1997
Last Successful Update:Fri Jun 06 1997
Number of topics:94
Total number of notes:6381

63.0. "EEG CMP DAILY PD" by STRATA::TDYER () Mon Nov 06 1995 10:31

    this note is for daily EEG cmp passdowns, it will cover cmpa1,a2,b1,b1
    and scruba1,2.
    
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63.1CMP PDSTRATA::TDYERMon Nov 06 1995 10:4948
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 4th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
                        		       Lock/Mail Stop: HLO1-1/p-11
      Matt Vanhenehem    
      Larry Camiletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

FAB4:
========
WSTK.1 - Continuing to run machine stacked pad.

WSTK.2 - Polish rate uniformity is hanging around the low end of spec ~-4%.
         Rate continue to rise. I can be reached at pager 508-387-1389 if
         things come to a stand still.
FAB6
======

A.1 - Both the Strasbaughs continue to break wafers, consumables running
      out....again. Polish rates have been running ~1400. A reduced down 
      of 40lbs (313 - 271) will be tried on A1. If MQCs pass they will run A1
      in this condition and monitor for breakage. The reduction of pressure
      may or may not cut down on the breakage.

A.2 - Running with 2 SUBA-IV and 1 IC1000.

B.1 - Continue to run ID/OD PAD and PROCESS per Pro Eng.

B.2 - Speedfam B2 facilitation has been completed and signed off. Today we
      filled the chiller. We had a couple of leaks, one at the ball valve 
      entering the polisher, pinched oring, and one on the DI line inside the
      fluids cabinet. Five Speedfam reps will be here Monday morning to start 
      the system up and begin mechanical acceptance. 

63.2CMP PDSTRATA::TDYERMon Nov 06 1995 10:5148
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 4th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
                        		       Lock/Mail Stop: HLO1-1/p-11
      Matt Vanhenehem    
      Larry Camiletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

FAB4:
========
WSTK.1 - Continuing to run machine stacked pad.

WSTK.2 - Polish rate uniformity is hanging around the low end of spec ~-4%.
         Rate continue to rise. I can be reached at pager 508-387-1389 if
         things come to a stand still.
FAB6
======

A.1 - Both the Strasbaughs continue to break wafers, consumables running
      out....again. Polish rates have been running ~1400. A reduced down 
      of 40lbs (313 - 271) will be tried on A1. If MQCs pass they will run A1
      in this condition and monitor for breakage. The reduction of pressure
      may or may not cut down on the breakage.

A.2 - Running with 2 SUBA-IV and 1 IC1000.

B.1 - Continue to run ID/OD PAD and PROCESS per Pro Eng.

B.2 - Speedfam B2 facilitation has been completed and signed off. Today we
      filled the chiller. We had a couple of leaks, one at the ball valve 
      entering the polisher, pinched oring, and one on the DI line inside the
      fluids cabinet. Five Speedfam reps will be here Monday morning to start 
      the system up and begin mechanical acceptance. 

63.3CMP PDSTRATA::TDYERMon Nov 06 1995 19:1742
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 6th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
                        		       Lock/Mail Stop: HLO1-1/p-11
      Matt Vanhenehem    
      Larry Camiletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

FAB4:
========
WSTK.1 - Continuing to run machine stacked pad.

WSTK.2 - Struggled with polish rate uniformity again today. Installed a machine
         stacked pad and unif came in at +14%. It looks like we need to
         re-evaluate machine or hand stacked. Rodel has been notified today
         of their latest instability!
FAB6
======

A.1/A.2 - See Frank's PD
B.1 - Continue to run ID/OD PAD and PROCESS per Pro Eng.

B.2 - System was powered up today, head rotation and oscillation tested. Every
      thing initialized except for the paddle. Speedfam is looking at the pad
      problem. Speedfam will be working around the clock with TWO crews. EEG
      techs work with the reps on startup, don't worry about getting in there 
      way. Please give an update  at your shifts end as to any startup issue.

63.4CMP PDSTRATA::TDYERWed Nov 08 1995 18:3139
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 8th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
                        		       Lock/Mail Stop: HLO1-1/p-11
      Matt Vanhenehem    
      Larry Camiletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

FAB4:
========
WSTK.1 - Continuing to run machine stacked pad.

WSTK.2 - Continuing to run machine stacked pads.
FAB6
======

B.1 - Continue to run ID/OD PAD and PROCESS per Pro Eng.

B.2 - Several minor problems corrected today, scrubber sensors, N2 ps2 switch
      and down force. Tonight the Speedfam 2nd shift will button things up
      and begin full cycling. This should include a touch down on the primary
      pad with one oscillation cycle and touch down on the 2nd table. See Earl
      Dowson for touch down wafers. If all goes well tonight, tomorrow morning
      we will start the 500 WAFER MECHANICAL ACCEPTANCE.

63.5CMP PDSTRATA::TDYERThu Nov 09 1995 15:0541
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 9th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
      Matt VanHanehem              	       Lock/Mail Stop: HLO1-1/p-11
      Larry Camilletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - PAD IS AT 600, needs to be changed.

 WSTK.2 - unif out of spec, pad at 250+, change pad.
 
 CMP.B1 - Slight vibration with new process, Larry will look into this
          problem.

CMP.B2 - System is now running the MECHANICAL ACCEPTANCE test. Currently at
         ~50 wafers. After the next boat the reps need to verify slot one
         of cassette 2. If this is correct the test may be resumed. Should
         the robot miss an other wafer from slot 1 of cassette 2, the test 
         will STOP and counters ZEROED (start  over). 2 assist are allowed
         through the acceptance marathon. If a failure occurs, the test will
         STOP and the reps will fix the problem. Once problem is fixed, 
         counters ZERORED and test will be re-started. If you have any question
         as to whether we have a failure or an assist or to re-start the
         test, give me a page on my long range pager, or at home. I will
         check in periodically. We are trying to get the Speedfam Process
         reps here for the weekend. 
 
63.6CMP PDSTRATA::TDYERFri Nov 10 1995 19:2440
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 10th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
      Matt VanHanehem              	       Lock/Mail Stop: HLO1-1/p-11
      Larry Camilletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.2 - MONTHLY PM IN PROGRESS.
 
 CMP.B1 - No issues.

 CMP.B2 - System ran with no problems up to 450 wafers. At 450 load cup 3 
          errored for "not up". The sensor was adjusted, not a major problem.
          We continued with the acceptance and agreed to run an additional
          100 wafers (600 total). At the 525 run, a wafer broke on the primary
          pad. The wafer came out of head 3 in pieces and the wafer detect
          stopped the table. THE ACCEPTANCE WILL BE RE-STARTED AT ZERO AND
          RUN TO 600. EEG, please build 5 new carriers for B2's testing.
          We need new carriers and I do not have want the Reps to build
          them because they do not build carriers on a regular basis. 
          Hopefully Mechanical will be completed by Sunday morning at which 
          time Process acceptance will start.

 A.1/A.2 - Please see Jim's and Eric's PD for the Strasbaugh plan. This really 
           needs everyone's team support.

63.7CMP PDSTRATA::TDYERSat Nov 11 1995 17:3744
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 11th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
      Matt VanHanehem              	       Lock/Mail Stop: HLO1-1/p-11
      Larry Camilletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD/B2 UPDATE
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1.2 - RUNNING WITH MACHINE STACKED PADS.
 
 CMP.B1 - No issues.

 CMP.B2 - More wafer breakage last night. A couple of problems were found and
          corrected; carrier balance pressures was too high, a corrupt file
          was found on the hard disk (hardware.500), the conditioner down 
          force was out of calibration. These items were corrected and wafer 
          test re-started. At 155 wafers it crashed, 15 seconds into step-3. 
          Step-3 ramp down force at the same time as ramping table speed from 
          15 to 29. The recipe was edited to match B1, constant table speed. 
          The carriers were rebuilt at 5.5-6.5, previously they were at 7.5-8.
          The mechanical acceptance is back in full swing AGAIN, currently at 
          ~50 wafers. Please assist the reps as needed. INSPECT WAFERS PRIOR
          TO LOADING ON B2. DO NOT POLISH ANY BARE SILICON WAFERS.
          THE ACCEPTANCE WILL RUN TO 600.  Hopefully Mechanical will be 
          completed by Sunday morning at which time Process acceptance will 
          start. I will check in periodically. Please page me if we crash or
          finish. There are more oxide wafers lots PA0710 - Pa0717 for B2.

 A.1/A.2 - Please see Jim's and Eric's PD for the Strasbaugh plan. This really 
           needs everyone's attention to detail.

63.8CMP PDSTRATA::TDYERMon Nov 13 1995 18:3540
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 13th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
      Matt VanHanehem              	       Lock/Mail Stop: HLO1-1/p-11
      Larry Camilletti
      Jim Tooker
      Eric Bodensieck
      Frank Krupa
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1. - No issues

 WSTK.2 - After monthly PM particles were high and polish rate low. The system
          was thoroughly cleaned and particles remained high at 2000. Changed
          final process pressure from 1psi to 5 psi and particles came in. This
          may be a down force calibration or down force ramp problem. A shift
          is looking at these. If particles are still high after cal, check
          particles again at 5psi on final. If particles, uniformity and
          polish rate are in, run system with 5psi on the final. Contact PSS
          for tdco/edco.
 
 CMP.B1 - Crashed wafer. One of the carriers lost a screw, this may have caused
          the crash. Also conditioner down force is at 40%, should be at 67%.
          New carrier will be installed and conditioner down force changed.

 CMP.B2 - Running process acceptance. Speedfam is trying to get the rate and
          uniformity in spec at this time. Particles were checked today with
          final process, all <600.

63.9CMP PDSTRATA::TDYERTue Nov 14 1995 19:3735
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 14th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1,.2 - No issues. There are 10 22.5" machined stacked pads in the FAB6
             CMP room. I some one gets a chance, please bring them to the
             WSTK room.

 CMP.B1 - High particles. Head-4 shaft and or rotary union is contaminated with
          rust. Speedfam will order the "worst case" parts to rebuild head-4's
          carrier drive shaft. In the interim, install a carrier on head-4 with
          a DF200 film with NO holes, this will act as a plug. Take head-4 off
          line, clean the index table, replace the pad and check MQC with 1,2,3,
          and 5. Once the parts are in, probably Thursday, we will schedule this
          major job, estimated 12+ hours.

 CMP.B2 - In process acceptance.

63.10CMP PDSTRATA::TDYERWed Nov 15 1995 17:4450
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 15th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1,.2 - No issues.

 CMP.B1 - High particles readings was due to incorrect data from the surfscan. 
          The surfscan recipe is optimized for 10K, the wafer, post polish, 
          have been closer to 8K, changing the "defects counted" by the 
          surfscan. See Pro Eng for the correct recipe.

*** Tomorrow morning CMP.B1 needs to go down for the HEAD-4 repair.***

 CMP.A1 - No issues.

 CMP.A2 - During lift OFF at the end of a 25 second PMD touch up, a wafer
          stuck to the pad instead of to the carrier film. The wafer stayed on
          the pad and hit the other head which was still trying to lift OFF.
          There has been success with  the "idle/ramp up" procedure for reducing
          breakage, maybe the lift off step needs to be optimized or the R200
          film tested.

 CMP.B2 - In process acceptance. A wafer broke today but did NOT cause a crash.
          A piece of a wafer from head-4 broke off and landed in the ID of the
          pad. The run finished polishing with out crashing and unloaded the
          broke wafer into the index table where it was noticed. Cause unknown,
          possibly a mis-load. Acceptance continues.

*** 28" SUBA-IV pads are not due in until MONDAY. If we run out, the top pads 
        ONLY may have to be pulled, leaving one SUBA-IV down on the platen. 
        Than installing the machine stacked pad on top of the "old" SUBA-IV.


63.11CMP PDSTRATA::TDYERThu Nov 16 1995 17:1249
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 16th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1,.2 - No issues.

 CMP.B1 - Head-4 was taken down at 10:45am to repair the rust problem. The
          compression fitting just below the rotary union was loose. Water
          was leaking by the fitting into the outer tube (drive shaft). The
          compression fitting was inspected, the shaft and fittings cleaned
          and fitting re-tightened. The system should be turned over for a
          PAD CHANGE and MQC's in the next � hour. 
        * 9 carrier plates are due in tomorrow 10:30am. 3 fully built carriers 
          are in standby for B1 in the event of a crash. Also If more than 3 
          new carriers are needed, remove them FROM B2. Again, nine new plates
          are due in tomorrow and 10 more on Saturday.

 CMP.B2 - In process acceptance. A wafer broke today AGAIN but did NOT cause 
          a crash. (NO THIS IS NOT YESTERDAY'S PASSDOWN).
          A piece of a wafer from head-2 broke off and landed in the ID of the
          pad. The run finished polishing with out crashing and unloaded the
          broke wafer into the index table where it was noticed. The type of
          break (chip) indicates a possible loader problem. The loader was 
          inspected and we found that most of the load cups were lifting TOO
          high. Also the load flipper was adjusted for parallel placement.
          Acceptance continues.

*** 28" SUBA-IV pads are not due in until MONDAY. If we run out, the top pads 
        ONLY may have to be pulled, leaving one SUBA-IV down on the platen. 
        Than installing the machine stacked pad on top of the "old" SUBA-IV.


63.12CMP PDSTRATA::TDYERFri Nov 17 1995 16:0950
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					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 17th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1,.2 - No issues.

 CMP.B1 - High unif on 1 minute MQC polish. The one minute polish does not 
          reap the benefits of the ID/OD process because half the time is
          spent ramping down in the center of the pad. Pro Eng will check
          unif with a two minute polish. The surfscan recipe will need to be
          changed or optimized for the new thickness. The touch down location 
          will also be looked at, see B2 note.

 CMP.B2 - A wafer broke again last night 7:00ish .
          The breakage was consistently at the notch, a weak spot. Since there
          was a breakage after the loader alignment, the loader was ruled out
          as a possible cause. The current process touches down on the pad with
          half the wafer hanging over the pad. This was suspected as the 
          breaking Mechanism. Touch down was changed to the center of the pad
          and ~400 wafers polished last night on FULL pad with NO problems. 
          The FULL pad test was all that was remaining of the MECHANICAL
          ACCEPTANCE. Last night's work satisfies those conditions, the system
          is "mechanically signed off". Process acceptance continues, the 
          3 minute 50 wafer test remains.

     * Should some problem arise with B2 or a serious problem with the other
       systems, I can be paged at 508-387-1389.
      
*** 28" SUBA-IV pads are not due in until MONDAY. If we run out, the top pads 
        ONLY may have to be pulled, leaving one SUBA-IV down on the platen. 
        Than installing the machine stacked pad on top of the "old" SUBA-IV.
          

63.13CMP PDSTRATA::TDYERMon Nov 20 1995 17:2538
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 20th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1,2 - Slurry filter drain valve is leaking, facilities call put in.
            Facilities is in "IT'S NOT MY JOB" mode...no surprise. Dan Smith  
            will replace the PVC valve. If we have any problems the EEG
            supervisor (Scott and or Larry ) need to fight it out with 
            facilities.......bottom line, just get it fixed.
            Put filter into BY-PASS for the repair, after the repair replace 
            the filter with NEW filter after repair.

 CMP.B1 - Recovering from yesterday's crash. 5 carrier came in, one was bad.
          Do NOT use carrier plate # 418. 6 more carrier plates due in 
          tomorrow, 10 more on Friday. A shift is performing loader alignments
          at this time. 

       ** B1 WILL RUN 50 WAFERS PRIOR TO RUNNING ANY PRODUCT, THIS MAY INCLUDE
          BREAKIN AND MQC WAFERS.

 CMP.B2 - Process work on hold, NO CARRIERS.
63.14CMP PDSTRATA::TDYERTue Nov 21 1995 15:2340
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					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 21ST, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Matt VanHanehem
         John Maze
                                    
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++


 I WILL BE OUT OF OFFICE THE REMAINDER OF TODAY AND RETURNING TUESDAY 11/28.
 PLEASE CONTACT JIM TOOKER AND OR TIM LANDRY AND OR JOHN POURIER FOR FAB6 
 ISSUES AND JOHN MAZE FOR ANY FAB4 ISSUES.


 WSTK.1,2 - No issues today. Could work by A,B shift repairing the slurry
            problem.

 CMP.B1 - Running with 4 heads. Waiting for a window to install and qualify
          the 5th carrier.

 CMP.B2 - Process work on hold, NO CARRIERS.

 SPEEDFAM HAS BEEN REQUESTED TO CONTINUE TO RUSH IN AS MANY POSSIBLE CARRIERS
 AS POSSIBLE UNTIL WE HAVE OUR COMPLETE INVENTORY BACK. WE SHOULD RECEIVE SOME
 TOMORROW AND SOME ON FRIDAY.

63.15couple of quickiesSUBPAC::LANDRYWed Nov 22 1995 19:2424
    A2 :  Slurry lines changed out.  Slurry pump calibration performed.
          The DI water valve didn't arrive.  See NOTE on A2 for shutdown
          game plan.
    
    
    B1 :  New pad installed.  A fifth head installed.  Full set of carriers
          built and are ready in the rebuild room.
    
    B2 :  A full set of carriers has been built (7.0 - 8.0 extention) and
          are in the rebuild room.  No need to put them on the system until
          Process Engineering is ready to resume development work.
    
    Speedfam:  More carrier pressure plates were sent out today.  Expecting
               more to arrive on Friday.  We look to be in pretty good
    	       shape atthis time
    
    Strasbaugh:  4 Carrier plates were shipped out today for Engineering
                 development work.  Plenty of spare plates are in-house
                 to satisfy the rooms needs.  Two new plates in the fab 6
                 stockroom, should they be needed.  If withdrawn, the 
                 helicoils and jack-screw threads need to be checked prior
                 to introducing them into manufacturing.
    
    					Doc  /  JP
63.16CMP PDLUDWIG::TDYERMon Nov 27 1995 17:2346
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 27th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - High (center fast) uniformity. After monthly Pm is complete, install
          HAND STACKED pads on this system.

 WSTK.2 - Westech is here to address the RPC-II failures. They will not take
          the system unless a failure actually occurs or if MFG releases the
          system. Currently the system is idle and the reps are browsing things
          over. They can stop at anytime. They will probably leave for the 
          night around 8ish. Please support them as needed.

 CMP.B1 - Running

 CMP.B2 - In process development.

 * FAB6 Slurry failed today shutting down all systems. Inadequate FLOW, not
   PRESSURE, caused the slurry to solidify in the returns of A2 and B1. Low flow
   quickly escalates into clogs which can quickly take down a slurry delivery
   system. Doc and Brenden have corrected the clogs, additionally they have set
   up CMP.A2 in a series loop like A1. The long term fix for the slurry 
   problems HAVE been planned by the "slurry team". The upgrade will include 
   removal of the filters in the chase for increased FLOW and reduced pressure
   and a pulsation dampner for spike reduction.

 * Carrier plates and pads arrived today.

63.17CMP PDLUDWIG::TDYERTue Nov 28 1995 16:3433
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 28th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD (JUST FOR YOU LARRY)
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - UP, NO ISSUES

 WSTK.2 - Westech was poking around the system looking at RPC-II errors. Some
          they broke the POLISH ARM up sensor. A new sensor is due in tomorrow.

 CMP.B1 - Running, assist today, 2 wafers dropped at lift off.

 CMP.B2 - In process development, see Frank for details.
                                                      
 * 15 carrier ring guides are on back order at Speedfam.

63.18CMP PDLUDWIG::TDYERThu Nov 30 1995 17:0152
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: November 30th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - UP, NO ISSUES

 WSTK.2 - Westech reps increased the power supply for the RPC-II INDEXER and
          tightened the rs232 cables. The system will be turned back over for
          production. If there is no product, please cycle dummies through the 
          system with a 5 second polish time.,,,,,,,,thanks.

 CMP.B1 - Running. As D shift indicated the crash was most likely due to the
          loose screws, see notes.

 CMP.B2 - Process development has been plagued by multiple hardware failures.
          The lifters were fixed toddy, development continues.
                                                      

        ****IMPORTANT SPEEDFAM NOTES****
 
         THE CARRIER SCREWS NEED TO BE TORQUED (with torque wrench) PRIOR TO
         EVERY MQC CHECK.
 
         THE NEXT TIME THE CARRIERS NEED TO BE REPLACED ON B1, PLEASE INSTALL
         TWO OF THE CARRIERS WITH METAL WASHERS. (already built). WE WILL
         COMPARE THE METAL WASHER CARRIERS TO THE PLASTIC WASHER CARRIERS.
      
         PRO ENG HAS INSPECTED THE 10 RE-WORKED CARRIER RINGS. FIVE ARE
         ACCEPTABLE, THE OTHERS HAVE BEEN DISPOSED OF OR MARKED AS BAD.

        ********************************
       

 
63.19CMP PDLUDWIG::TDYERFri Dec 01 1995 16:2060
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 1st, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - UP, Exit cassette errors, last night and this morning. Elevator and
          exit slide positions were calibrated.
          
 WSTK.2 - The reps finished up there work on RPC-II. We will not be sure 
          this unit is fixed until it has run for a week or so with out error.

 CMP.B1 - Wafers broke last night, indications were that the wafer cracked
          during loading or early in the polish cycle, possibly at touch down.
         
          PLEASE COMPLETE THE FOLLOWING PLAN BEFORE RELEASING TO MFG:
 
          1) Set all load cup heights.
          2) Set all load cup speeds
          3) Set up load and unload flipper alignment
          4) Verify ALL recipes touch down in the center of the pad.
          5) Cycle 50 wafers on the brakin recipe, set polish time to
             15 seconds or so.

       * Curently running two carriers with metal washers.

 CMP.B2 - Index table errored today for cup not down, the screen was touched
          and the table continued to drive into the unload mushroom. The
          mushroom was TOO LOW and was just bearly clearing the fork. A new
          UNLOAD mushroom was installed with 3/16" clearance between the
          bottom of the mushroom and the cup fork. Retrained the load and
          unload flippers. Process development continues.

        ****IMPORTANT SPEEDFAM NOTE****
 
         THE CARRIER SCREWS NEED TO BE TORQUED (with torque wrench) PRIOR TO
         EVERY MQC CHECK.

        ********************************
       
  If you need to reach me over the weekend, page me at 508 387-1389. There
  is no local Speedfam coverage this weekend.

 
63.20CMP PDLUDWIG::TDYERTue Dec 05 1995 17:2655
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 5th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - DOWN, Currently having wafer transfer problems.
          
 WSTK.2 - UP. 
                  **WSTK NOTE** 
 We are continuing to work the Rodel pad problem. In the interim we will
use two pad configurations, MACHINE and HAND stacked. This will be left to
the judgment of the WSTK MFG TECHNICIANS. The basic premise is this; HAND
stack pads is the preferable method, they typical are more stable. However,
if a hand stacked pad has had a short life (<150 wafers) due to negative 
uniformity, a MACHINED stacked pad should be installed. MACHINE stacked pads 
start with a very CENTER FAST polish rate, for this reason they require ~25 
breakin wafers as apposed to the standard 8. I hope this helps clarify the
difference between the two pads and gives you some flexibility. I will
request SR-94 to carry both types.
                  *************

 CMP.B1 - UP, Vacuum problem again today. Pump was replaced and clogged removed
          from line.
       * Currently running two carriers with metal washers.

 CMP.B2 - #1 lifter did not fully lower one of the load cups today. Speedfam
          has been requested to fix this re-occurung problem. When they are
          done, I would like to cycle wafers through the system ALL night.
          Use Franks's process acceptance recipe, change polish time to 17 
          seconds. Please document ANY errors or assist. I want to make sure
          we get the BUGS out before the system is release later this week.

        ****IMPORTANT SPEEDFAM NOTE****
 
         THE CARRIER SCREWS NEED TO BE TORQUED (with torque wrench) PRIOR TO
         EVERY MQC CHECK.

        ********************************
63.21CMP PDSTRATA::TDYERWed Dec 06 1995 18:5748
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 6th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - UP

 WSTK.2 - UP. 

 CMP.B1 - Load cup-3 error last night, sensor was restricting movement, good
          work by B shift. Elevator-1 failed to index today. A wire was broke 
          during an inspection earlier in the morning, wire repaired.

 CMP.B2 - Last night after the EVAC the system was left to DRY. Please make an
          effort to keep ALL the CMP systems in wet mode. If your not sure of
          the status of a system, contact the EEG Techs or their supervisor,
          thanks. When we tried to initialize the system today, head-5 failed
          to home. The rotation infornor fried. A new one is due in tomorrow,
          not sure why smoked.         

 * FIVE COMPLETE SPEEDFAM CARRIERS ARRIVED TODAY. (These  are the "owed to
   digital for B1's problems" carriers. They can be used on any system.
 
 * THIS NOW GIVES US 25 CARRIERS AND 45 CARRIER PLATES.
 
       ****IMPORTANT SPEEDFAM NOTE****
 
         THE CARRIER SCREWS NEED TO BE TORQUED (with torque wrench) PRIOR TO
         EVERY MQC CHECK.

       *******************************
63.22CMP PDSTRATA::TDYERThu Dec 07 1995 17:2746
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 7th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
    cc:  Larry Camilletti
         Jim Tooker
         Eric Bodensieck
         Frank Krupa
         Kyle Wooldridge
         Matt VanHanehem
                                             
==============================================================================
SUBJECT:  CMP PD 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 WSTK.1 - UP

 WSTK.2 - UP. 

 CMP.B1 - Inverter errors and vacuum errors last night. Today we looked for 
          the source of the reoccurring vacuum liner clogging problems. The
          vacuum tank was dis-assembled and the popet valve was found to be 
          leaking by. Brings replaced, vacuum system is back up. Inverter errors
          were caused by wafer loss detector-4. The beam was half on carrier
          4, causing a false wafer loss condition, beamed moved.

 CMP.B2 - Infornor replaced, carrier 5 running OK. After Frank finishes his
          work tonight, please cycle wafers through "no-touch". Thanks.

* PAD VIDMAR MOVED INTO THE CMP ROOM AND CARRIER VIDMAR MOVED FROM CMP ROOM
  TO CARRIER ROOM. IF ANYONE FEEL AMBITIOUS, THE NEW BIN HOLDERS NEED TO 
  BOLTED TO THE TABLE IN THE CARRIER ROOM.

       ****IMPORTANT SPEEDFAM NOTE****
 
         THE CARRIER SCREWS NEED TO BE TORQUED (with torque wrench) PRIOR TO
         EVERY MQC CHECK.

       *******************************
63.23CMP PDSTRATA::TDYERFri Dec 08 1995 16:4656
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 8th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                    
==============================================================================
SUBJECT:  CMP PASSDOWN (please read B2 plan) 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down, System is lost. It just polished with 4 heads down, 1 up and
         with the table not spinning. Appears to be brain damage. System
         reset, rep is looking over system t this time.

CMP.B2 - Down. Index table, load cup and sensors due in tomorrow 8-9am, possibly
         later due to the storm. John or Brad, please check with security, 
         they HAVE been notified that parts are coming in. Please follow the 
         plan:

Friday night
1) Run Osco and Rosco on ALL heads.

Saturday 
1) Receive parts.
2) Install sensor.
3) Measure all ten cut outs in index table with telescopic gauges.
4) Label matching cups.
5) Measure MATCHING load and unload cups outer diameter (make detailed list)
6) Install Index table (do not install cups)

Sunday
1) Check alignment of all heads

Monday
1) Dis-assemble cups
2) Bring cups to machine shop

Tuesday
1) Pick up cups
2) Assemble cups and install
3) Run marathon.
63.24CMP PDSTRATA::TDYERMon Dec 11 1995 16:5148
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 11th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                    
==============================================================================
SUBJECT:  CMP PASSDOWN 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - up, Brenden did weekly today.

CMP.B2 - Down - Index table installed, sensor replaced. All load and unload
         cup shafts were measured and compared to their respective holes
         in the index table and to the Speedfam spec. MOST of the shaft were
         out of spec, they were too large. The Speedfam spec is 2.480 - 2.484,
         most were above 2.484. All shafts were turned to upper spec limit.
         Tonight please;
          - clean cup parts.
          - assemble cups, use blue Loctite.
          - install cups in dedicated holes.
          - fill with water and check for smooth operation.
          - Let index table soak for 4+ hours, recheck for smooth operation.
            If OK, run the NO_TOUCH recipe for the remainder of the night.
          * If cups show signs of hesitation after they have been soaking,
            disassemble the cups and they will be machined again, this time
            to the bottom of spec, 2.480".

   NOTE: Today we tested the honing method on the old table. Holes which
         were oblong to begin with became even worse after honing. DO NOT
         USE THE HONNER ON THE INDEX TABLE.


63.25CMP PDSTRATA::TDYERTue Dec 12 1995 19:2445
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 12th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                    
==============================================================================
SUBJECT:  CMP PASSDOWN 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - up, with elevator-2 off  line. Waiting on new dump valve.
         FYI, tomorrow we will probably install a new conditioner.

CMP.B2 - Verify - Currently 200 wafers into the marathon....looking good
         so far, no it's not a jinx, I'm not superstitious,,, yet.
         New pads and two new carriers installed. All cups tested for
         smooth operation. The following wafers ran:

         150 - NOTOUCH
           5 - bin1
           5 - bin2
           5 - bin3
           5 - breakin
          30 - mec2-acp

       Please continue to cycle wafers through MEC2-ACP all night. Just
       make sure there is oxide left on the wafers....thanks.
       If all goes well tonight, tomorrow we will check MQCs.
       

63.26CMP PDSTRATA::TDYERWed Dec 13 1995 16:5940
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 13th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                    
==============================================================================
SUBJECT:  CMP PASSDOWN 
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - up, with elevator-2 off line. The part is in, we just need time
         (~1hour) to install and test. Waiting for a window from MFG.
         The rep will try again in the morning.

CMP.B2 - Verify - System ran 410 wafers last night with out error. We
         started MQCs and the 1st run mis-loaded in head-3. Load cup-3
         is the new cup that Speedfam just sent us. It had the wrong type
         of springs. They were steel and rusted, restricting the secondary
         cup movement, causing the mis-load. Springs replaced with stainless
         steel. During the next MQC run the system load two wafers into
         one load cup, reason not known. Ran 25 more wafer followed by MQCs.
         MQCs failed for high uniformity. Please clean system, clean the
         conditioner, etc, replace pad, break in pad and check MQCs. Tomorrow
         if MQCs are good Pro Eng will run a lot and check post readings.

63.27CMP PDSTRATA::TDYERThu Dec 14 1995 13:3737
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 14th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                    
==============================================================================
SUBJECT:  CMP START UP
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Replace pads and carrier

WSTK.2 - Replace pads and carrier.

CMP.B1 - Carriers are soaking. Replace both pads.

CMP.B2 - Carriers are soaking, replace pad.

SCRUBBERS - The brushes are going to be removed and soaked in DI. If they
            are still moist at start up. Install THESE brushes. IF they are
            dry put on new brushes. THIS IS A CHANGE FROM JIM'S PASSDOWN, AFTER
            HIS PASSDOWN WENT OUT, WE LOCATED SOME DI WATER. Contact JIM 
            TOOKER if you have any questions on this.

I can be paged at 508 387-1389 if you have questions.

63.28CMP PDSTRATA::TDYERFri Dec 15 1995 17:4435
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 15th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                     
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP

WSTK.2 - Monthly PM completed, good turn around by Brad.

CMP.B1 - Up. Vacuum error today. The blow down was set to 3psi, we have 
         increased this to 15 psi. B2 is at ~20psi, it has the same hardware,
         valves, lines, etc as B1 so there should be no reason why B1 can not
         handle the additional pressure. This should produce a more thorough
         blow down of the vacuum tank. A new vacuum tank popet valve has also 
         been ordered. When the valve arrives, please schedule time with MFG 
         to install it and the elevator-2 quick dump valve.

CMP.B2 - Verify.  On Sunday Eric B. will run MQC's and the 1st LOT.

63.29CMP PDSTRATA::TDYERMon Dec 18 1995 17:0131
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 18th, 1995
                                               From: Timothy P. Dyer
 					       Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa
         Larry Camilletti
         Eric Bodensieck
         Jim Tooker
         Matt VanHanehem
                                     
==============================================================================
SUBJECT:  CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP

WSTK.2 - UP

CMP.B1 - UP.

CMP.B2 - UP. PLEASE RESPOND TO THIS SYSTEM, IT IS NOW RELEASED TO MFG.

 ....PASSDOWN WASN'T EVEN WORTH KILLING AN ELECTRONINC TREE OVER

63.30CMP PDSTRATA::TDYERWed Dec 20 1995 16:2853
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: December 20th, 1995
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD  and some  "STANDING ORDERS"
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP

WSTK.2 - UP

CMP.B1 - UP.

CMP.B2 - UP.           
    Continued from B shift on load gripper finger problem. The source of
    the double loading wafers has been attributed to the fingers sticking
    closed. B shift installed a pressure gauge inline with the gripper.
    The gripper was cycled, the fingers opened slowly and made a squeaking
    noise, also pressure was at 40. B1 fingers move fast and the pressure
    is at 60. Increased B2 gripper pressure to 60. Fingers move quicker
    but still squeaked. Cleaned and olied guild rails. Cycle 50 wafers
    with out error. Returned to MFG.

===========================================================================
    
IN FAB6 PLEASE ADHERE TO THE FOLLOWING PROCEDURES, STANDING ORDERS IF YOU 
WILL, UNTIL FURTHER NOTICE. 

1) CMP.B1,2 - PRIOR TO EVERY MQC, THE SYSTEMS NEED TO BE CLEANED OF DRIED
   SLURRY. ON B2 MAKE SURE THE SLURRY DELIVERY FOUNTAIN IS SCRUBBED AND
   THE SIDES OF THE CARRIERS. The current configuration does not scrub the
   carriers. Dried slurry causes scratches.

2) CMP.B1 - UNTIL WE FIX THE ULTIMATE ROOT CAUSE OR UPGRADE THE VACUUM
   SYSTEM, I WOULD LIKE THE CHECK VALVE, NEEDLE VALVE AND PUMP FILTER
   CLEANED PRIOR TO EVERY MQC. (This should happen at least once every
   24 hours). I want us to be pro-active hear until we can make a permanent
   fix. It will be quicker if the check valve is replaced with a spare
   and then the old clean for the next change out.

    
63.31CMP PDSTRATA::TDYERTue Jan 02 1996 16:1363
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 2nd, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP

WSTK.2 - UP

CMP.B1 - UP.
       - The system did not want to cooperate today during MQCs. Head-4
         failed to rotate, Tim L. found the connector loose on DCX bd-2.
         The conditioner failed to go home. A broker wire was found on the
         connector for the "conditioner at home" sensors. Eventually we
         ran MQC's. High particles were described as a "streak" by B shift. 
         We noticed that some of the wafers today after polish had a steak,
         a 1" by 3" stripe of THIN oxide. This may be a film quality
         issues from the CVD tools. The oxide may be less dense in the 
         striped area and polished faster. The thinner oxide causes problems
         when reading on the Tencor. All MQCs passed.

CMP.B2 - UP.
       - Continued with high uniformity. The carriers were removed and checked
         by Pro Eng (TJB) on the P2. The curvature was ~ -15u, it should be 
         closer  to -2u. The carriers were replaced, the bad plates marked
         as bad. MQC's passed with the new plates.

 *** NOTE: IF MQCs FAIL ON THE SPEEDFAMS, TRY ADJUSTING THE OD IN THE RECIPE.
           INCREASE THE OD IF THE REMOVAL IS TOO CENTER SLOW, DECREASE IF THE
           REMOVAL IS TOO CENTER FAST. ***

++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
    
IN FAB6 PLEASE ADHERE TO THE FOLLOWING PROCEDURES, (STANDING ORDERS IF YOU 
WILL) UNTIL FURTHER NOTICE. 

1) CMP.B1,B2 - PRIOR TO EVERY MQC, THE SYSTEMS NEED TO BE CLEANED OF DRIED
   SLURRY. ON B2 MAKE SURE THE SLURRY DELIVERY FOUNTAIN IS SCRUBBED AND
   THE SIDES OF THE CARRIERS. The current configuration does not scrub the
   carriers. Dried slurry causes scratches.

2) CMP.B1 - UNTIL WE FIX THE ULTIMATE ROOT CAUSE OR UPGRADE THE VACUUM
   SYSTEM, I WOULD LIKE THE CHECK VALVE, NEEDLE VALVE AND PUMP FILTER
   CLEANED PRIOR TO EVERY MQC. (This should happen at least once every
   24 hours). I want us to be pro-active hear until we can make a permanent
   fix. It will be quicker if the check valve is replaced with a spare
   and then the old clean for the next change out. (Parts due in 1/21)

    
63.32CMP PDSTRATA::TDYERThu Jan 04 1996 17:2235
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 4th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP. 

WSTK.2 - UP

CMP.B1 - down external.
       - Waiting on new (good) carrier plates from Speedfam.
       - The infranor re-wire upgrade was completed successfully today and the
         Scrubber upgrade is almost complete.

CMP.B2 - Verify, running MQCs, 5 plates arrived today.
       - The load gripper failed to open at the load cup. Since the mechanical
         movement of the gripper is actualy smooth, the problem may actualy
         be the DI not comanding or the soliniod not opening. Please monitor 
         the DI for LOAD GRIPPER OPEN and the soliniod durring transfers 
         tonight.

63.33CMP PDSTRATA::TDYERFri Jan 05 1996 16:1835
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 5th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP. 

WSTK.2 - UP

CMP.B1 - 5 plates arrived, Brad is building carriers.

CMP.B2 - Vacuum errors today after exiting the MAPPER page. During mapping the
         system blows down the vac tank. It than takes approximately 9-11
         seconds to regain full (18") of vacuum. The vacuum blow down time may
         be too long. This may be set to 10-15seconds. To change blow down time,
         in DOS, edit "CDATA", there is a line for blow down time. Also the
         vacuum sensor on the tank should be set for ~17" NOT 13".

* 5 plates due in tomorrow, 10 on Monday *


63.34CMP PDSTRATA::TDYERMon Jan 08 1996 12:5436
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 8th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD/PLAN FOR START UP AFTER PLANT CLOSURE
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Put in wet idle.
WSTK.2 - Put in wet idle.

CMP.B1 - Crashed wafers today while running on 4 heads. Head 3 will NOT
         rotate under LOAD conditions. We swapped out the rotation infranor
         with B2's head-2 rot. Rotation needs to be test under load (377lbs).
         If head-3 fails under load, remove the carrier and let them run with
         4 heads. Speedfam will address it when the weather lets them arrive.
         
CMP.B2 - Continued wafer loss problem. Tried B1's loss pcb in B2, same problem.
         Removed DO 30,31,32,33,34 one at a time, a false detect was still
         present. This confirms what B shift found, it is a wiring or 24v 
         problem. The wafer detect is jumpered out and system in wet mode. 
         Please do not run product with no wafer loss detection with out 
         contacting me first. I have requested a faxed schematic of the wafer
         loss bcp, it may arrive some time today.

63.35CMP PDSTRATA::TDYERTue Jan 09 1996 17:2836
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 8th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP.
WSTK.2 - UP.

CMP.B1 - We replaced ALL the lugs at head-3's infanor connector and it worked
         under load. Head-4 also would not work under load today. At the
         terminal board on the left side of the multi-head, we swapped the
         3 motor phases. We swapped them at this location because access
         is best. Originally the phases from top to bottom on the terminal
         board was U, V, W (Sine, com, Cosine). They are now wired V, W, U 
         (com, Cosine, Sine). ALL heads tested OK, MQCs pass and system is
         up. I will schedule some time and we will re-label the wires in their
         current location.
 
CMP.B2 - Still NO wafer detection. A split lot will be run tonight for
         Pro ENg on this system. Please watch ALL runs closely. Do not run
         any other product on this with out Engineering permission.
         Speedfam WILL be in tomorrow to adress this problem. 
63.36CMP PDLUDWIG::TDYERWed Jan 10 1996 18:0231
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 10th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP.
WSTK.2 - UP. Monthly completed.

CMP.B1 - Scratches today. Bevels were cut on the ID of the pad and B2's
         conditioner installed. Scratches appear to be under control.

CMP.B2 - Wafer detection is fixed. The reps still need to look at the
         intermittent load gripper problem and intermittent head-1 not rotating
         error. They may or may not address these last two items tonight. After
         they leave please turn the system over for FULL mqcs. Thanks.
         If B2 mqc's show scratches, the conditioner (from B1) is bad and we 
         will be forced to rush qual blocky.
63.37CMP PDLUDWIG::TDYERThu Jan 11 1996 19:4050
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 11th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Down for part. Needs 24v valve for vac system.

WSTK.2 - UP.

CMP.B1 - Scratches today. Earlier in the day scratches were reviewed under a 
         scope, they appear to be slurry particles and not scratches. After 
         several more experiments we reviewed more wafers and found DEFINITE 
         scratches cut into the oxide.
        
         The following has been eliminated:
         1) Loader
         2) Scrubber
         3) conditioner wheel.
         
         Please follow the following action plan:
   
        * Slurry filter just changed
        * keep carriers wet in cart.

          1) Calibrate conditioner down force.
          2) Clean entire MULTIHEAD, remove covers as required.
          3) Clean carriers and conditioner with plastic brush and DI.
          4) Install all covers including the TOP cover which has been off
             for months.
          5) Install pad, carriers and recheck mqcs
  

CMP.B2 - Wafer detection fixed, lifter to carrier alignment corrected. 
         Vacuum system upgraded. Back to MFG. Looks like it should be going
         up shortly.

63.38CMP PDLUDWIG::TDYERFri Jan 12 1996 18:0042
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 12th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Down for part. Needs 24v valve for vac system.

WSTK.2 - UP.

CMP.B1 - Scratches cont.
         While a plan was being formulated, the reps completed the VACUUM
         system upgrade. Today we calibrated the conditioner down force 
         77lbs at 100%. Calibrated all carrier down force, cleaned the
         conditioner bearings and gave the multi head a high pressure
         blow down. Lots of metal and slurry particle "rained" down onto
         the table. Particles from the pad sample from last night, were
         reviewed under the scope. They appear to be metallic in color and
         have the shape of metal shavings. After the system is wiped down
         and pad installed, please run normal break-in of all mqc pass
         run system. If they fail for scratches, install a BLOCKY
         diamond conditioner (there in the yellow cabinet). Replace pad,
         break in and recheck. If scratches are Ok with blocky, contact
         engineering at home before committing product. If bad again. remove 
         pad. Extract ~2-3gls of slurry from A1,2 or B2. Plumb up the manual 
         pump and bucket of slurry to deliver to the Madonna cup. Replace 
         pad, break in and check with manual slurry system.

CMP.B2 - UP.
63.39CMP PDLUDWIG::TDYERMon Jan 15 1996 18:4447
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 15th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP.

WSTK.2 - UP.
                                                              

CMP.B2 - UP.

CMP.B1 - Scratches cont.
         The bypass slurry experiment and "no edge" process experiment was
         completed today. Also all head's DI was sprayed into a wipe and
         particles reviewed under the scope.
         We know TWO things for sure at this point; (1), heads 1,3,5 are
         blowing rust through the vacuum/blow off line, and (2) scratches
         are less if we do not touch the edge of the pad with the wafer.
         The contamination (rust) WILL scratch the wafers. This is going
         to be addressed 1st. It may be possible that the contamination is
         collecting on the outer edge of the pad and thus scratches
         increase if we polish in that area. 

   PLAN: Speedfam is ordering 5 complete sets of parts to rebuild all 5 heads.
         This will include new rotary unions, tubing, fittings and gauges.
         It is late in the day, the parts may not arrive until Tuesday.
         If that is the case, we will have them complete as many OPEN
         upgrades as possible on Tuesday.
   TONIGHT: Begin disassembly of the multi head: remove all five quick
         disconnect fixtures and bellows. Remove the "T", gauges, clear 
         tubing and lower 2 solenoid valves. Clean quick disconnects.
         Please keep all the parts organized in bins or trays. 
63.40CMP PDLUDWIG::TDYERTue Jan 16 1996 18:3953
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 16th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP.

WSTK.2 - UP.
                                                              

CMP.B2 - Scratches. With standard process scratches were very high 100mm+.
         Wafers were polished with out touching the edge of the pad, only
         one wafer was scratched ~5mm. The pad was beveled and a standard 
         MQC was run, lots of scratches. All carriers were removed, totally 
         dis-assembled and wafer chips and dirt removed. Index table and
         polish area cleaned and new carriers built. A standard ID/OD pad with
         inside and outside edges beveled was installed. Running normal breakin
         at this time, followed by full mqcs. 
 
 PLAN:   If there are scratches, set the manual condition pressure to 100% and
         run 300sec of conditioning. Change the PAD CONDITION recipe for the
         IO_MQC recipe to 100% also. Run 10 breakin and recheck MQCs.
         If there are still scratches, install the IC1000/GS100 pad (cut to
         standard ID/OD, remove burs), run normal breakin and re-test. This
         is an old IC 1000 it will rule out a Rodel pad process change or 
         pad problem.

CMP.B1 - Scratches cont.
         All 5 head totally disassembled, head TWO would not come apart, it the
         spline shaft was RUSTED inside and rusted to the quick dis-connect.
         Speedfam has ordered a new spline shaft. The other heads will be re-
         assembled tonight. We do not expect the system to be ready for test
         until late Wednesday night.
       + New vacuum tank installed, this completes the vacuum system upgrade.
       + Cassette elevator controllers re-wired today.


 *** 10 Speedfam plates due in tomorrow ***

63.41CMP PDSTRATA::TDYERWed Jan 17 1996 17:5848
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 17th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP. Weekly completed

WSTK.2 - UP. Weekly completed
                                                              

CMP.B2 - Scratches last night. We ran a wafer transfer and noticed that one of
         the wafers (while in the carrier) scratch on the top of the load cup.
         The heads moved in before the cup was all the way down. The load cup
         sensor-3 was replaced. SYSTEM RUNNING WITH 4 HEADS ONLY UNTIL WIP
         CLEARS. THE RESOLVER CABLE BETWEEN THE TB AND THE RESOLVER/MOTOR
         HAS AN OPEN AT THE BEND NEAR THE BOTTOM OF THE MOTOR.
          
Plan for tonight:
         Run standard MQCs with lift off in the center of the pad. If they
         are good, run 12 (4X3) and repeat MQCs. If they are good change ALL
         recipes to center lift. If they fail than Install the IC1000/GS100 
         pad (it's on the xformer). If this fails cut a standard pad to the
         following specs: remove 1 inch from the outer Diameter, and cut a 
         14" ID. Breakin and test.

IF THERE ARE ANY HARDWARE PROBLEMS ON B2, PAGE DARREN, 800-823-6094

CMP.B1 - Four of the five heads are 95% complete. Head-3 is waiting on a new 
         shaft, due tomorrow. Please see Darren for what he would like done
         and NOT done overnight.


 *** 10 Speedfam plates due in tomorrow ***

63.42CMP PDLUDWIG::TDYERFri Jan 19 1996 16:3259
    +---+---+---+---+---+---+---+
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 19th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
                                     
==============================================================================
SUBJECT: B1, B2 WEEKEND PLAN.
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - UP.

WSTK.2 - UP.                                                  

CMP.B2 - Should be up here shortly....
         Low slurry flow today and last night. Supply and return valves were
         adjusted to increase flow to B2. Once again we are at the limitations
         of the parallel loop system. If the flow becomes a problem over the
         weekend, replace the filter and purge the two 1/2  supply and 
         return lines and valves from the box under the floor to the back of
         B2. Also today, the delivery tube cracked,  it has been welded it 
         back together and is being instaled at this time.

         WHEN B1 COMES UP, THE RESOLVER CABLE BETWEEN THE LEFT SIDE TERMINAL
         BLOCK AND THE ROTATION MOTOR, NEEDS TO BE REPLACED.


CMP.B1 - All 5 heads are completely assembled and down force calibrated.
         During initialization the loader robot failed. We had no luck 
         making repairs on-site. Speedfam has hand carried the robot and
         controller to ADE in Newton Mass. We hope to get this back no later
         than tomorrow. After the robot is up and running the multi-head
         needs to be tested. The multi-head needs to cycle wafers with
         NO vacuum errors or leaks, no other errors (rotation, etc).
         Once the integrity of the multi-hed is verified. Clean the system,
         install a standard ID/OD pad and breakin. Perform TWO mqc checks,
         one with the standard mqc recipe and one with CENTER lift off
         MQC. If there are no scratches on the standard recipe, product
         may be run. If there are scratches on the standard and not on the
         center lift, change ALL recipes to center lift and release for
         production.

DO NOT WET THE CARRIERS ON B1 UNTIL WE ARE READY TO TRANSFER WAFERS, THEY ARE
BRAND NEW, ONCE THEY ARE WET THEY MUST STAY WET.

IF THERE ARE ANY HARDWARE PROBLEMS ON B1,2, PAGE DARREN, 800-823-6094. I CAN
BE REACHED AT HOME.

 *** 20 Speedfam scrubber brushes due in tomorrow ***

63.43CMP PDSTRATA::TDYERWed Jan 24 1996 16:3929
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 24th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down for robot. The robot has returned from ADE, the reps are 
         installing it at this time. They will test the robot with the
         PC and software ~1000x.

CMP.B2 - up

63.44CMP PDSTRATA::TDYERThu Jan 25 1996 16:4530
    +---+---+---+---+---+---+---+
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 25th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down for robot AGAIN. Z axis failed today. Speedfam is on their way
         back to ADE to pick up another robot. While they are out please take
         a look at the squeaking carrier and PULL the robot and controller out.
         After the robot is installed cycle 100 wafers though transfer.

CMP.B2 - up

63.45CMP PDSTRATA::TDYERFri Jan 26 1996 17:4234
    +---+---+---+---+---+---+---+
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 26th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
WSTK.1 - up

WSTK.2 - up

CMP.B1 - VERIFY. Needs mqcs. If mqc look horrible, replace ALL the carriers
         and the pad. 3rd robot installed, calibrated and aligned today.
         The is a spare robot and controller in the chase.

CMP.B2 - VERIFY. Needs mqc. Running on 4 heads until a head-5's load cylinder
         arrives tomorrow. Brad, please try to schedule time around noonish to
         replace the cylinder.

 * I WILL BE OUT MONDAY, SEE JIM TOOKER FOR FAB6 ISSUES AND BOB DEJORDY FOR
   FAB4 ISSUES *

63.46CMP PDSTRATA::TDYERTue Jan 30 1996 17:0247
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    | d | i | g | i | t | a | l |	  
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 30th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Down, Platen rinse ring is cracked. Ring needs to be poly-welded.

WSTK.2 - up

CMP.B1 - up

CMP.B2 - Down. The index table alignment to the 5 carrier heads is NOT
         repeatable. This is causing the wafers to mis-load into the
         carriers, at touch down this cause the wafers to slip out and 
         CRASH. The following components that make up the index table
         sub-system have been replaced and tested:
          DXC control PCB
          Ifranor
          Power supply, infranor
       
         A new motor and resolver is on order , due in tomorrow.
       
       - Monitor the index table DCX/Infranor ckt with an O-scoope. Look for 
         spikes after re-setting DCX (sliding door open than close). Check
         at the input to the infranor, out from the infranor, resolver input
         to the infranor and power supply input too the infranor.

       - While the system is down, if time permits, please complete any PMs 
         which are due. Also the system could use a good cleaning.
    
* DO NOT RELEASE CMP.B2 TO MFG WITH THIS CONDITION *

63.47CMP PDSTRATA::TDYERWed Jan 31 1996 18:3235
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: January 31st, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - Down, Platen rinse ring is cracked. Ring needs to be poly-welded.
         Westech has not been able to ship this part yet.
WSTK.2 - up

CMP.B1 - up

CMP.B2 - Down. System is not expected to come up anytime soon, maybe sometime
          Friday. B2 continues to have index table problems. The cause for the
          table jerking is a noise signal 2vpp. We have not been able to
          isolate the noise, except for the fact that it can be toggled on and
          off with the DCX channel enable for the index table. Tonight:
          check all earth grounds, install NEW DCX board, wait for further
          instructions from Speedfam Phoenix. I have requested immediate
          additional support from Phoenix......waiting.
 
63.48CMP PDSTRATA::TDYERThu Feb 01 1996 19:2438
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 1st, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - up

CMP.B2 - Down. Isolated index table problem today. The infranor which was
         installed during trouble shooting was also bad, so we moved on to
         other components. Today we revisited the infranor and determined it
         as well as head-4 rotation was bad. Neither infranor was holding
         auxiliary power to the servo motors, so when the infranor were re-
         activated (closing the doors) the infranor would send a ~60v
         spike. We are waiting on two new infranor, due in tomorrow.
         Tonight, please clean up the tool, install carriers on heads-1,2,3
         and put in wet mode. Tomorrow an Engineer from INFRANOR will be here
         to view the problem in person.

         
63.49CMP PDSTRATA::TDYERWed Feb 07 1996 18:0647
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 7th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down, failed MQCs for unif, two heads are ~11% center fast. Carrier
         screws will be re-tightened and MQC will be re-checked. If it fails
         for scratches, please replace pad and clean system, dump index table
         and clean conditioner ring.
 

CMP.B2 - Sched_Down for scrubber upgrade, ~2 hours of work remaining. 

 *** NOTE FOR FAB6 ***

   SPEEDFAM CARRIER RETAINING RING BOLTS PLASTIC WASHERS ARE BEING REPLACED WITH
   A STEEL FLAT WASHERS AND A STEEL LOCK WASHER. IF ANY CARRIERS ARE REBUILT,
   PLEASE USE THIS COMBINATION. ONCE ALL CARRIERS ARE OUTFITTED WITH THE STEEL
   WASHERS, I WILL DISPOSE OF THE PLASTIC ONES. FYI, TOQUE WRENCH IS SET TO
   5LBS.

   DO NOT POWER AND SPEEDFAM UP FOR 2 MINUTES AFTER ANY POWER DOWN OR EMO. 
   INFRANOR ENGINEERS SUSPECT CAPACITOR DISCHARGE WITH IN THE INFRANOR CAUSING 
   REDUCED LIFE TIME OF THE INFRANOR AMPLIFIERS.

 If the are any Speedfam issues, page Daniel Carter. 

63.50CMP PDSTRATA::TDYERThu Feb 08 1996 16:5754
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 8th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down for Scrubber upgrade and to repair the head-1 failure problem.
         The scrubber upgrade will have to be put off, most of the time
         has been spent on the head-1 problem.

CMP.B2 - Failed MQCs for particles. A new pad has been installed, running
         break-in. 

      ** THE TOOLS ARE GENERALLY FILTHY, THE POLISHERS MUST BE SCRUBBED DOWN
         PRIOR TO EVERY MQC. IF WE DON'T CLEAN THEM FREQUENTLY, THE FILTH
         WILL GET AWAY FROM US AND OUT OF CONTROL **
         
         The carrier film is either expanding upward or the retaining ring is
         being pulled downward after several days of sitting idle. Last night
         several carriers were found at .009-.012", ALL of these carriers
         were verified by several individuals last Friday as being .007 - .008.
         We will monitor the situation. If the ring is being compressed
         downward due to the spring tension in the lock washer, we will have to
         go back NO lock washers and possibly add lock-tite. If the film is 
         absorbing moisture and expanding, we may be require to put carriers 
         in a controlled environment or building them on demand. A decision will
         be made tomorrow evening.

*** IF ANY WAFERS SLIDE OUT TONIGHT, CHECK EXPOSURE, IF IT IS >.008, REPLACE
    ALL THE STEEL WASHERS WITH THE STANDARD PLASTIC WASHERS AND SET HEIGHTS
    FOR .007-.0008". ***

   DO NOT POWER AND SPEEDFAM UP FOR 2 MINUTES AFTER ANY POWER DOWN OR EMO. 
   INFRANOR ENGINEERS SUSPECT CAPACITOR DISCHARGE WITH IN THE INFRANOR CAUSING 
   REDUCED LIFE TIME OF THE INFRANOR AMPLIFIERS.
63.51CMP PDSTRATA::TDYERFri Feb 09 1996 18:4758
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 9th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up, MONTHLY COMPLETED.

WSTK.2 - up

CMP.B1 - Down for head-1 troubleshooting. The system will be returned in the
         next hour with FOUR heads. Here's what we found today:

           Swapped the motor and resolver cables for head 1 and 5 on the
           RIGHT side of tb-13.
         * The problem moved to head-5 (head-5 stalled)
           We put the wires back to normal on TB13
           Swapped mtr-3 cable (head-1 rot) with mtr-12 cable (head-5 rot) and 
           their respective resolver cables on the LEFT side of the bulk-
           head connections under the polish area.
         * The problem moved to head-5.
         * So, we have a bad cable between the bulk head connector and the
           INFRANOR for head-1 rotation. (the infranor was already replaced)
           The connector itself could be bad,please inspect. If nothing 
           obvious is found, put system back together with heads 2-4 ONLINE.
           The reps will replace the cable next week.

         - At one point both head-5 and head-1 stalled, for this reason I have
           also request a flex track motor cable.
         
CMP.B2 - UP.

********NOTES**********
  
   THERE WAS NO NOTABLE MOVEMENT ON THE CARRIERS BUILT YESTERDAY WITH METAL
   AND PLASTIC WASHERS. WE ARE BUILDING UP A SET OF METAL WASHER CARRIERS
   AND A SET OF METAL LOCK + PLASTIC WASHER CARRIERS. ONE SET WILL BE INSTALLED
   AND EACH SYSTEM AND MONITOR. NOTE, WHEN THE FILM IS WET IT DOES EXPAND AND
   THE READINGS WILL BE DIFFERENT THAN WHEN ORIGINALLY DRY.

   DO NOT POWER AND SPEEDFAM UP FOR 2 MINUTES AFTER ANY POWER DOWN OR EMO. 
   INFRANOR ENGINEERS SUSPECT CAPACITOR DISCHARGE WITH IN THE INFRANOR CAUSING 
   REDUCED LIFE TIME OF THE INFRANOR AMPLIFIERS.
63.52CMP PDSTRATA::TDYERMon Feb 12 1996 16:1833
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 12th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - UP WITH 4 HEADS, waiting on parts and time to repair head-5.
         
CMP.B2 - Sched_Down. Oscillation calibration completed today, tool cleaned
         and new pad and carriers installed. This system will stay Sched 
         down for the next THREE days for Pro Eng work with Speedfam Reps.

        SYSTEM HAS BEEN SITTING IDLE ALL AFTERNOON WAITING FOR WARM UP WAFERS!
         
63.53CMP PDSTRATA::TDYERTue Feb 13 1996 19:0635
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 13th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - Down, scrubber failed, unit upgraded, upgrade is complete, reps are
         calibrating unit. A pot was broken off the Amp pcb, if there are
         no scrubber amp pcb in stock, re-solder a new pot onto the board.
         
CMP.B2 - Sched_Down. Running Eng exp with SF, also load gripper height is
         being tweaked in by Doc at this time.

   * ALL SPEEDFAM CARRIERS ARE TO BE BUILT WITH A FLAT METAL WASHER AND A
     METAL LOCK WASHER *

63.54CMP PDSTRATA::TDYERFri Feb 16 1996 18:0248
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 16th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - sched_Down. After Pro Eng finishes experiments, run MQCs. If scratches
         show on wafer, replace the pad. Break in and re-test. If there is
         still scratches, replace pad and install STANDARD conditioner,
         break in and re-test.
         
CMP.B2 - Verify. We had TWO types of wafer LOSS today; at touch down, and
         at lift off. The lift off problem was due to extreme surface tension
         and head-5 had a small vacuum leak. The leak has been fixed and the
         recipe lift off speed has been changed to help reduce the surface 
         tension. The (head-5) TOUCHDOWN problem is a handler issue, possibly
         the load cup. Load cup five was placed into slot-1, where it moves
         a little smoother, and cup-1 in slot-5. 25 wafers ran without 
         problems. If a wafer slips out of head-5 or head-1 at TOUCHDOWN
         take that head OFFLINE for the weekend. SF will address on Monday when
         new loader parts arrive.

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE ASSISTANCE OVER THE WEEKEND, 
       PAGE TONY AT 800-516-4197

     * ALL SPEEDFAM CARRIERS ARE TO BE BUILT WITH A FLAT METAL WASHER AND A
       METAL LOCK WASHER *

 
63.55CMP PDSTRATA::TDYERMon Feb 19 1996 16:2750
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 19th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up

WSTK.2 - up

CMP.B1 - Verify, pad change. Frank and Erik are testing different ID lift-offs.
         
CMP.B2 - Down. Lost wafer out of head-5 at touch down......loader problem.
         Doc, Brenden, Mich, Bob, and Roger please work with the reps and
         keep somewhat to this plan:

         1) Isolate the cause for mis-loading, fix if possible, if it requires
            new inside shaft, leave that head off line until parts arrive
            tomorrow.
         2) Replace carrier-5 with a 28 hole carrier.
         3) Set ALL vacuum sensors higher (~21") test for errors by partially
            loading wafers, adjust as required to detect mis-load but not 
            faults errors.
         4) Run ~100-150 wafers on the MQC recipe with a primary polish time of
            20 seconds.

        If Erik and Frank have success on B1 with lift off, the recipes on B2
        will be changed and the 2nd table will be turned back on.

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE ASSISTANCE PAGE TONY AT 800-516-4197

     * ALL SPEEDFAM CARRIERS ARE TO BE BUILT WITH A FLAT METAL WASHER AND A
       METAL LOCK WASHER *

 
63.56CMP PDSTRATA::TDYERTue Feb 20 1996 18:2853
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 20th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - PM in progress.

WSTK.2 - up

CMP.B1 - Verify, pad change after scratches. Frank reduced the conditioner DF
         to 67%, TABLE SPEED 37, TIME 71S. A segment was added between 3-4
         to reduce vibration at table ramp. 
     
      * OSCILLATION CHANGES TO B1'S RECIPES SHOULD BE MADE TO SEG 5,6 NOT 4,5.
        TIME CHANGES SHOULD BE MADE TO SEG 5.
    
CMP.B2 - UP - All the inner shafts of the load cups were replaced today. Load
         cup-5's outer shaft was machined back into spec. The system has been 
         released to MFG with out head-5. If MFG can release B2 for 1 minute
         and has time to re-check MQCs, install CUP-5. Test for smooth
         operation. If any wafers come out a touch down, leave the SYSTEM
         down, 5 COMPLETE NEW load cups are due in tomorrow.  Frank reduced 
         the conditioner DF to 67%, TABLE SPEED 37, TIME 71S.

     * OSCILLATION CHANGES TO B2'S RECIPES SHOULD BE MADE TO SEG 4,5.
       TIME CHANGES SHOULD BE MADE TO SEG 4.
     
     * PLEASE KEEP AN EYE ON LIFT-OFF, IF ANY WAFERS DROP, PLEASE NOTE WHICH 
       TYPE OF WAFERS THEY ARE, IE BARE SILICON, OXIDE, PRODUCT?

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE REP ASSISTANCE PAGE TONY AT 
       800-516-4197

     * ALL SPEEDFAM CARRIERS ARE TO BE BUILT WITH A FLAT METAL WASHER AND A
       METAL LOCK WASHER *

 
63.57CMP PDSTRATA::TDYERWed Feb 21 1996 16:2653
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 20th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - Verify. Frank was able to eliminate scratches and reduce particles by
         doing CENTER lift off with SLURRY on. 
    
CMP.B2 - DOWN. Load flipper box has been repair. All LOAD and UNLOAD cups have
         been replaced with new. Index table honed to match GO/NOGO gauges.
         TONIGHT:

            1) Install new cup locking pins
            2) Set ALL cup to carrier head heights
            3) Align ALL head to CUPS with fixtures
            4) Align gripper to load/unload cups
            5) Cycle 50 wafers through NO_TOUCH
            6) Cycle 100 wafers through QUIK_TCH

        If NO wafers slip out or crash, the system can be released to MFG.
        ALL 5 heads should be enabled and the 2nd table.

     * PLEASE KEEP AN EYE ON LIFT-OFF, IF ANY WAFERS DROP, PLEASE NOTE WHICH 
       TYPE OF WAFERS THEY ARE, IE BARE SILICON, OXIDE, PRODUCT?

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE REP ASSISTANCE PAGE TONY AT 
       800-516-4197

     * ALL SPEEDFAM CARRIERS ARE TO BE BUILT WITH A FLAT METAL WASHER AND A
       METAL LOCK WASHER *

 5 SF plates arrived today and 50 2nd table pads.
 
63.58EEGNETRIX::&quot;[email protected]&quot;TimMon Feb 26 1996 15:012
This is a www entry test.
[Posted by WWW Notes gateway]
63.59t2NETRIX::&quot;netrix::&quot;@t.tdyer.hlo.dec.com&quot;tdMon Feb 26 1996 16:042
t2 www
[Posted by WWW Notes gateway]
63.60CMP PDSTRATA::TDYERTue Feb 27 1996 17:0148
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 27th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - up.  The mapper failed, boards re-seated and now it is working
         again. This is the second time in 3 weeks which the mapper unit has 
         failed and has mysteriously gone away. A request to SF for a new
         mapper controller has been made, purchasing is addressing.
       - Should the mapper fail tonight, page SF, manually map the wafers
         until the new controller arrives.
       - MQCs will be conducted with the edge lift at 125, if they pass all
         recipes need to be modified.
    
CMP.B2 - UP. The flipper to load cup alignment was adjusted today. The alignment
         is still not prefect, a compromise between opposite load cups was 
         settled on Speedfam needs to address LONG-TERM.
       - EDGE LIFT is back on...... The high speed high flow water process was
         modified to lift off at 125, no scratches present.
       - Running with pre-cut pad.

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE REP ASSISTANCE PAGE TONY AT 
       800-516-4197
     
     * 10 SF plates due in tomorrow and  5 due in on Thursday.

     * 10 bad plates need to be shipped back to SF tomorrow.

63.61CMP PDSTRATA::TDYERThu Feb 29 1996 16:4245
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: February 28th, 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - Verify. Old mapper re-installed with NEW cables. Should the mapper
         fail, go into the MANUAL mode and continue running. We will address 
         with SF in the morning. Slurry pump-1 was replaced today. Should the 
         system loose slurry during processing with no explanation, page SF,
         replace the supply V70,71 (there is one in the SF cabinet).
       - Both slurry channels were calibrated today for 500ml with a 500ml
         set point.
    
CMP.B2 - UP.
         Please do not discard carriers if the polish rate uniformity
         is CENTER fast, adjust the ID/OD and re-test. Center fast is indicated
         by +++++ in the center of the one dimensional map or a hump upward 
         in the center on the 3d map. See Pro Eng for more details  regarding 
         this issue.

     * ANY SPEEDFAM PROBLEMS WHICH REQUIRE REP ASSISTANCE PAGE TONY AT 
       800-516-4197
     

  leap day!~$!~$!%
63.62C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Mar 09 1996 15:3138
                   CMP Equipment Engeering Passdown for:
                          9-MAR-1996 15:26:16.66

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A2     REPAIR        
CMP.B1     UNSCHED_DOWN  
--------------------------------------------------------------------------------
DOWN EQUIPMENT:



--------------------------------------------------------------------------------
HIGHLIGHTS:


                                TEST MESSAGE



_______________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          D       W            RR         3/6/96		107.359
CMP.A2
                                                                            
CMP.B1          A       W            BD       	3/3/96		116.170       
CMP.B2          
CMP.B3          C       M            MT         3/8/96		108.275


CMP_SCRUB.A1    A       BW            EG         3/5/96		113.81
CMP_SCRUB.A2    C       M             KF         3/8/96          106.353

63.63C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Mar 09 1996 15:3338
                   CMP Equipment Engeering Passdown for:
                          9-MAR-1996 15:26:16.66

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A2     REPAIR        
CMP.B1     UNSCHED_DOWN  
--------------------------------------------------------------------------------
DOWN EQUIPMENT:



--------------------------------------------------------------------------------
HIGHLIGHTS:


                                TEST MESSAGE



_______________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          D       W            RR         3/6/96		107.359
CMP.A2
                                                                            
CMP.B1          A       W            BD       	3/3/96		116.170       
CMP.B2          
CMP.B3          C       M            MT         3/8/96		108.275


CMP_SCRUB.A1    A       BW            EG         3/5/96		113.81
CMP_SCRUB.A2    C       M             KF         3/8/96          106.353

63.64C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Mar 09 1996 19:4036
                   CMP Equipment Engeering Passdown for:
                          9-MAR-1996 19:34:34.31

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A2     REPAIR        
--------------------------------------------------------------------------------
DOWN EQUIPMENT:

CMP.B1 - Tool went down for low removal rates.  The pad was replaced and 
	 process area was cleaned up by production.  While getting ready 
	 to run the breakins we received a carrier #4 rotation error.  No
	 breakers were tripped but the infranor was reading motor over temp
	 error.  Reset the system and the carrier ran without any further
	 errors.  Currently running MQCs.


_______________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          B        W            RG         3/3/96	          6.23
CMP.A2          D        M            BJ         3/7/96           8.21
                                                                            
CMP.B1          D        W            BJ         3/5/96          18.25        
CMP.B2          A        W            TL         3/4/96          20.16
CMP.B3                                                                 


CMP_SCRUB.A1    D        W            BJ         3/4/96		 37.23
CMP_SCRUB.A2    D        W            BJ         3/6/96          39.21  

================================================================================
63.65C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Mar 14 1996 19:3645
                   CMP Equipment Engeering Passdown for:
                         14-MAR-1996 19:30:22.24

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

--------------------------------------------------------------------------------

DOWN EQUIPMENT:

CMP.A1 - Down for broken wafers on the polish table.  Could not determine any
	 definite cause.  Pulled the pad and cleaned up the process area.  The 
	 carriers were replaced and the conditioning disc was checked and 
	 cleaned.

Carriers assembled and ready for use:

Speedfam:
 12 carriers ready,
 8 new plates in the room,                                                     
 8 used plates packed and ready for shipment,
 1 Speedfam link up assembly packed and ready to be shiped for repair.
 2 secondary housings cleaned and ready for assembly.

_______________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          B        W            RG         3/11/96	  6.24
CMP.A2          B        W            RG         3/10/96          8.22
                                                                            
CMP.B1          B        W            PR         3/13/96         18.26        
CMP.B2                   SA                          
CMP.B3                                                                 


CMP_SCRUB.A1    D        W            BJ         3/11/96	 37.24
CMP_SCRUB.A2    D        SA           BJ         3/14/96         39.22  

================================================================================

63.66C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Mar 15 1996 19:4869
                   CMP Equipment Engeering Passdown for:
                         15-MAR-1996 19:39:29.77

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A1     PART          
CMP.A2     REPAIR        

--------------------------------------------------------------------------------

DOWN EQUIPMENT:

CMP.A1 - Tool is down for robot pickup/handling problems. The robot vacuum
         switch was recalibrated and the handling problems disappeared for
         a few hours only to reappear later in the shift. 

         Strasbaugh was contacted and they suspect we have a vacuum leak 
         somewhere between sol #44 and the robot end effector. Trace hose
         # 94 for leaks.

         NOTE: A new slurry filter was installed on the tool today. 

CMP.A2 - Down for breaking wafers during polish.  Originally Suspected poor 
	 slurry flow to be the problem.  The filter was checked and it was 
	 heavily clogged with slurry.  The filter was Changed out with a new 
	 one that was sent in FEDEX.  The polish area was cleaned and pad and
	 carriers were changed by production. The problem reoccurred while ops 
	 was tring to run there breakins.  Pulled the pad and cleaned up the 
	 mess.  Checked the carriers for any obvious defects, none were found. 
	 O-rings between  the spindle and carrier.  The same seemed good.  Ran 
	 out of time.  The tool presently sets with 2 new carriers and no pad 
	 on the table.

CMP.B1 - Down for breaking a wafer from carrier #3 in segment 5.  Suspect that
	 the problem was caused by a dip in slurry flow due to the operator 
	 reports of a loud vibration previous to the crash.  The slurry filter 
	 was checked and looked good but was replaced as requested by engineer-
	 ing.  The slurry flow for both pumps was out by about 100ml/min.  The
	 same was corrected.  The process area was cleaned up, pad replaced w/
	 a prestamped.  The index table was drained and wiped out.  Only
	 carrier #3 needed to be changed out.  Gave the tool back to
	 production. 

CMP.B2 - The tool had a problem with scratches on wafers from head #1.  The
	 load/unload cups were wiped out and the index table drained, the 
	 carrier inspected and the final polish pad was changed out to adress
	 this problem.  Still had what appeared to be scratches but process
         found it to be dried slurry.  Tool was allowed to run.

_______________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          B        W            RG         3/11/96	  6.24
CMP.A2          B        W            RG         3/10/96          8.22
                                                                            
CMP.B1          B        W            PR         3/13/96         18.26        
CMP.B2                   SA                          
CMP.B3                                                                 


CMP_SCRUB.A1    D        W            BJ         3/11/96	 37.24
CMP_SCRUB.A2    D        SA           BJ         3/14/96         39.22  

================================================================================

63.67CMP PDSTRATA::TDYERTue Mar 19 1996 16:4136
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: March, 19th 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - Up with warning, 4 heads.      The reps spent some time today
         trouble shooting both problems. The mapper problem was not
         identified. It has been put back on line, keep an eye on it. The
	 reps have ordered diagnostic software for the pc. They will directly
         connect the PC to the mapper and trouble shoot the problem. The
         head-4 rotation problem is believed to be the resolver cable inside 
         multi-head. Head-4 will stay off line until the new cable arrives.

CMP.B2 - UP.

        
63.68CMP PDSTRATA::TDYERWed Mar 20 1996 18:1032
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: March, 20th 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - up, on 4 heads and manual mapper. PLEASE MANUALLY DUMP THE VACUUM TANK
             EVERY 50 WAFERS.

CMP.B2 - DOWN. Wafer crash, after vibration. Looks like another SLURRY flow
         problem. Please check the B2 loop frequently for proper flow.

        
63.69CMP PDSTRATA::TDYERThu Mar 21 1996 16:4632
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: March, 21st 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
     cc: Frank Krupa                               
         Larry Camilletti
         Eric Bodensieck
         Dennis Goodwin
                                     
==============================================================================
SUBJECT: CMP PD
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

WSTK.1 - up.

WSTK.2 - up

CMP.B1 - Down, reps working on head-4 and mapper problem. If mapper does not 
         come up, continue with manual vacuum tank dump.


CMP.B2 - UP. John and or Reps, check exit track-2, several wafers mis-loaded
         into cassette two today.
        
63.70CMP PDSTRATA::TDYERFri Mar 22 1996 09:0227
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: March, 22nd 1996
                                               From: Timothy P. Dyer
                                               Dept: Engineering
                          	               Ext:  5072  
     		                               Node: Scoman::Tdyer
                                     
==============================================================================
SUBJECT: SPEEDFAM PAGER
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 The ONSITE Speedfam reps have a Digital INHOUSE pager. Please page them
in the event of a down Speedfam polisher in addition contact our technicians
if they are not in the room. 
 
 The Speedfam pager is 361. 

 After hours, if there are problems which require rep assistance, page them
long range. 

 3/18-4/1  Ian Lowbridge 1-800-514-0541
63.71C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Mar 28 1996 19:4885
                   CMP Equipment Engeering Passdown for:
                         28-MAR-1996 19:40:21.22

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP-SCRUB. EXTERNAL      
CMP-SCRUB. EXTERNAL      
CMP.A1     EXTERNAL      
CMP.A2     EXTERNAL      
CMP.B1     EXTERNAL      
CMP.B2     EXTERNAL      

--------------------------------------------------------------------------------

DOWN EQUIPMENT:

*General note                                

  The following CMP room modifications have been completed. The CMP systems
 are officially released to MFG at 9:00pm tonight. Prior to 9:00pm, the
 pads, carriers and scrub brushes can be installed and break/test wafers
 run. DO NOT RUN ANY PRODUCT PRIOR TO 9:00PM.

      system	purpose			task/results                          

       DI	Increased pressure   t-	Remove fixed udr orifices and tie to 
 					larger DI supply header.
				     r-	increased pressure and flow at all
					systems. Pressure at the scrubbers
 					is 43psi. Polishers are at 41psi.

     SLURRY	Increased flow       t- Re-route piping to series loop
		reduce clogs         t- Remove local filters
		reduce pulsation     t- Install pulsation dampner
				     r- Increased flow, reduced pulsation.
		                     ?- Connection to CMP.B3 still needs to
					be evaluated 4/5/96.

       GCW	prevent back ups     t- Replace 2" drain line with 3" line
				     r- Improved flow.

       PCW	tie in for CMP.B3	Done

                                                      -Tim D.

CMP.B1 - The resolver cables to all the carrier rotation motors were swapped
	 with a more durable type of cable.  The system was checked out by
	 SF by exercising the carriers w/ the ROTGO command.  The tool
	 presently sets needing consumables, brushes, breakins and MQCs.


CMP.B2 - The resolver cables to all the carrier rotation motors were swapped
	 with a more durable type of cable.  Circuit breaker # 10 was upgraded
	 from a .5 amp to a 1 amp breaker.  The chiller was hooked up for
	 interface with the tool.  The resolver cables  were checked out by
	 SF by exercising the carriers w/ the ROTGO command.  The chiller still
	 needs to be calibrated by SF.  The tool presently sets needing 
	 consumables, breakins and MQCs.

CMP.A1 - The tool needs the consumables replaced and the breakins and MQCs
	 performed.

CMP.A2 - The tool needs the consumables replaced and the breakins and MQCs
	 performed.
 
________________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          
CMP.A2                                                                   
                                                                            
CMP.B1                                                                        
CMP.B2                                               
CMP.B3                                                                 


CMP_SCRUB.A1                                                          
CMP_SCRUB.A2                                                            

================================================================================
					  
63.72C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Mar 29 1996 19:4749
                   CMP Equipment Engeering Passdown for:
                         29-MAR-1996 19:40:24.99

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B1     UNSCHED_DOWN  

--------------------------------------------------------------------------------

DOWN EQUIPMENT:

CMP.B1 - Down for Carrier rotation errors.  Both carriers #1 & #5 recieved the
	 errors but carrier #1 was still turning.  Checked to insure that all 
	 of the cables to the DCX board & the wires to the infranors were in
	 place.  The problem still occured.  The down force and slurry flows
	 were checked.  The same were good.  The pad was changed and motor 5
	 was swapped out with another motor, still had the problem.  The mother
	 DCX board was then swapped out.  Sill got the carrier rotation errors.
	 The reps are presently swapping the infranor.

Cmp.B2 - Has a warning for elevator #2 wafer handling problems that will be
	 addressed when we can get the tool.

SCRUB.A1 -   
    The Inside Brush Station Shaft/Arm Assembly has been removed
    from WL-Scrub.A1 in the Wet Lab and installed into CMP-Scrub.A1
    in CMP. CMP-Scrub.A1 is currently running verification wafers.
    We will WUP the system after another sucessful run of 25 wafers.
    This latest run will be completed at 7:25 p.m.
 
________________________________________________________________________________
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1          
CMP.A2                                                                   
                                                                            
CMP.B1                                                                        
CMP.B2                                               
CMP.B3                                                                 


CMP_SCRUB.A1                                                          
CMP_SCRUB.A2                                                            

================================================================================
63.73C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Mar 30 1996 19:4267
                   CMP Equipment Engeering Passdown for:
                         30-MAR-1996 19:38:32.88

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP-SCRUB. REPAIR        

================================================================================

DOWN EQUIPMENT:

CMP.B1 - The tool was put up with an assist in reference to a moisture sensor
	 alarm. Found The drip pan under the unload station with water in it.
	 The leak was coming from where the fitting on the quick dump drain 
	 screws into the main drain.  This was caused by a tie wrap anchor 
	 coming loose allowing the tubing to fall into the path of the 
	 elevators' travel.  The QD drain & cascade drain tubing were securly 
	 tie wrapped out of the way and the pan and sensor were cleaned up.
   
CMP.B1 -
    IT NOW APPEARS THAT DUE TO THE MANY ARM 3 ROTATION ERRORS THAT THE
    INFRANOR WE REPLACED WAS ALSO BAD. I REPLACED ARM 3 ROTATION INFRANOR
    (WHICH WAS ORIGINALLY ARM 5'S) WITH A KNOWN BRAND NEW ONE.
    
    RAN 25 WAFERS ALL O.K. NOW EARL IS RUNNING MQC'S
    
    IAN LOWBRIDGE(SPEEDFAM)

CMP.B2 - 
    
    TOOK A LOOK AT CROSS-SLOTTING PROBLEM ON ELEVATOR 2 AND FOUND 2
    PROBLEMS.
    
    1.	C CLAMP THAT HOLDS THE FIBRE OPTIC CABLES IN PLACE, WHICH IS
    LOCATED TO THE REAR OF THE FLOAT SWITCHES WAS CAUSING THE FLOAT TO
    STICK DOWN. THIS MADE THE QUICK FILL SWITCH ON AND CHANGE THE WATER
    LEVEL IN THE ELEVATOR, SO CAUSING CROSS SLOTTING.
    
    I ROTATED THE CLAMP ON BOTH ELEVATORS 180 DEGREES SO THAT CABLES WERE 
    ROUTED FURTHUR AWAY FROM FLOAT.
    
    2.	THE CASSETTE PRESENT SWITCHES WERE LOOSE AND WERE ALLOWING THE
    CASSETTES TO MOVE ON THE EVEVATOR DUE TO THEIR LOOSE FIT. THIS WAS
    CAUSING MINOR ERRORS WITH SOFTWARE THINKING THE CASSETTE WASN'T PRESENT
    BECAUSE THE SWITCHES WERE NOT ALWAYS BEING MADE.
    
    READJUSTED THE SENSOR CLAMPS NEARER TO CASSETTE TO ENSURE POSITIVE
    SWITCH ACTION AND MAKE CASSETTE A TIGHTER FIT ON BOTH ELEVATORS
      

                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         B       WEEKLY          RP        03/27/96        6.26
CMP.A2         B       WEEKLY          RP        03/24/96        8.24          
                                                                            
CMP.B1         D       WEEKLY          BJ        03/25/96       18.28       
CMP.B2         A       WEEKLY          BF        03/24/96       20.20
CMP.B3                                                                 

CMP_SCRUB.A1   B       WEEKLY          RP        03/24/96       37.26       
CMP_SCRUB.A2   B       WEEKLY          RP        03/24/96       39.26         

================================================================================
63.74C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALWed Apr 03 1996 20:3842
                   CMP Equipment Engeering Passdown for:
                          3-APR-1996 19:32:11.41

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A1     UNSCHED_DOWN  
CMP.A2     UNSCHED_DOWN  

================================================================================

DOWN EQUIPMENT:

CMP.A1 - Down for losing wafers from the right carrier.  The tool twice lost
	 wafers from the right carrier.  While inspecting the carrier strings
	 of what appeared to be film debris was left on the pad.  Decided to
	 start from scratch by changing out both carriers, conditioner disc and
	 the pad.  The tool now failed MQCs for a center slow uniformity. 

CMP.A2 - Down for failing MQCs for poor uniformity.  Changed the pad and had
	 the same problem.  I believe the pads to be the culprit because CMP.A2
	 has the same problem and they both had the same lot# pad on.  The 
	 suspected bad lot# is 6CU-JP1.  The tool presently sets with a new pad
	 installed (6CB-JQ1) needing MQCs to verify a fix.               


                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         B       WEEKLY          RG        04/02/96        6.27
CMP.A2         B       WEEKLY          BF        03/31/96        8.25          
                                                                            
CMP.B1         D       MONTHLY         TL        04/02/96       18.29       
CMP.B2         A       WEEKLY          BJ        INCOMPLETE     20.22
CMP.B3                                                                 

CMP_SCRUB.A1   B       WEEKLY          TL        04/02/96       37.27       
CMP_SCRUB.A2   B       WEEKLY          RP        04/02/96       39.27         

================================================================================
63.75C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Apr 04 1996 20:3932
                   CMP Equipment Engeering Passdown for:
                          4-APR-1996 19:32:27.09

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

DOWN EQUIPMENT:

CMP.A1 - Down for breaking wafers on the polish table.  Broke wafers while 
	 Process Engineering was performing experiments.  Cleaned up the mess 
	 and replaced the pad.  The tool is back to production.

                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         B       WEEKLY          RG        04/02/96        6.27
CMP.A2         B       WEEKLY          BF        03/31/96        8.25          
                                                                            
CMP.B1         D       MONTHLY         TL        04/02/96       18.29       
CMP.B2         A       WEEKLY          BJ        04/04/96       20.22
CMP.B3                                                                 

CMP_SCRUB.A1   B       WEEKLY          TL        04/02/96       37.27       
CMP_SCRUB.A2   B       WEEKLY          RP        04/02/96       39.27         
CMP_SCRUB.A2
================================================================================
63.76C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Apr 05 1996 20:3631
                   CMP Equipment Engeering Passdown for:
                          5-APR-1996 19:31:22.97

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

DOWN EQUIPMENT:

                               NO ISSUES


                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         B       WEEKLY          RG        04/02/96        6.27
CMP.A2         B       WEEKLY          BF        03/31/96        8.25          
                                                                            
CMP.B1         D       MONTHLY         TL        04/02/96       18.29       
CMP.B2         A       WEEKLY          BJ        04/04/96       20.22
CMP.B3                                                                 

CMP_SCRUB.A1   B       WEEKLY          TL        04/02/96       37.27       
CMP_SCRUB.A2   B       WEEKLY          RP        04/02/96       39.27         
CMP_SCRUB.A2
================================================================================
63.77C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Apr 06 1996 20:3845
                   CMP Equipment Engeering Passdown for:
                          6-APR-1996 19:31:58.18

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A1     UNSCHED_DOWN  
CMP.B2     REPAIR        

================================================================================

DOWN EQUIPMENT:

CMP.B2 - Down for no wafers on carriers and DI leaking from the unload station.
	 Tool was down from this morning for DI leaking from the unload
	 station.  The previous shift had siliconed the leak and asked for us
	 to verify the fix.  Found it to still be leaking from the new silicone
	 weld.  Stopped working on this issue because Production asked for the
	 tool.  When the wafers were picked from the index station a "wafer
	 missing from carriers 1,2,3,4,5" error was recieved.  Vacuum could be
	 felt on the wafer.  Checked the vacuum and it was pulling 22 inches in
	 the pnuematics cabinet and 18 the multihead.  The wafers seemed to be
	 loaded ok but the alignments were Checked anyway.  The alignments
	 looked good but a small adjustment was made carriers #3 (15 out) and
	 #5 (20 out).  Ran 5 more wafers and recieved the same alarm.  Ran out
	 of time.

CMP.A1 - Needs a pad change.

                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         B       WEEKLY          RG        04/02/96        6.27
CMP.A2         B       WEEKLY          BF        03/31/96        8.25          
                                                                            
CMP.B1         D       MONTHLY         TL        04/02/96       18.29       
CMP.B2         A       WEEKLY          BJ        04/04/96       20.22
CMP.B3                                                                 

CMP_SCRUB.A1   B       WEEKLY          TL        04/02/96       37.27       
CMP_SCRUB.A2   B       WEEKLY          RP        04/02/96       39.27         
CMP_SCRUB.A2
================================================================================
63.78C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Apr 11 1996 20:3742
                   CMP Equipment Engeering Passdown for:
                         11-APR-1996 19:31:51.76

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

DOWN EQUIPMENT:

CMP.A2 - Slipping wafers.  Changed the pad and ran Barry's modified breakin 
	 method.  where 200 lbs. of down force was applied for 4 wafers than 
	 250, 260, 270, 280, 290 300, 313.  This was done because the fly outs
	 were thought to be caused by the pad not breaking in.   Process also 
	 extended the rate of ramp to help aliminate friction on the pad.


CMP.B2 - Down for scratches.  Cleaned conditioners and process area but did not
	 pull pads as requested by process. Also drained and pulled the load 
	 cups and wiped out the index table and unload tracks.  The scrubber 
	 brushes were checked and rinsed.  Tool is presently getting MQCs

.
                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         D       WEEKLY          BJ        04/08/96        6.28
CMP.A2         B       MONTHLY         RP        04/10/96        8.26          
                                                                            
CMP.B1         D       WEEKLY          BJ        04/10/96       18.30       
CMP.B2         D       WEEKLY          BJ        04/10/96       20.23
CMP.B3                                                                 

CMP_SCRUB.A1   D       WEEKLY          BJ        04/08/96       37.28       
CMP_SCRUB.A2   B       WEEKLY          RP        04/08/96       39.26         
CMP_SCRUB.A2
================================================================================
63.79C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Apr 12 1996 20:2234
                   CMP Equipment Engeering Passdown for:
                         12-APR-1996 19:15:39.86

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

DOWN EQUIPMENT:


                               NO ISSUES



                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         D       WEEKLY          BJ        04/08/96        6.28
CMP.A2         B       MONTHLY         RP        04/10/96        8.26          
                                                                            
CMP.B1         D       WEEKLY          BJ        04/10/96       18.30       
CMP.B2         D       WEEKLY          BJ        04/10/96       20.23
CMP.B3                                                                 

CMP_SCRUB.A1   D       WEEKLY          BJ        04/08/96       37.28       
CMP_SCRUB.A2   B       WEEKLY          RP        04/08/96       39.26         
CMP_SCRUB.A2
================================================================================
63.80C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALWed Apr 17 1996 20:4937
                   CMP Equipment Engeering Passdown for:
                         17-APR-1996 19:43:30.20

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

DOWN EQUIPMENT:


  The software on CMP.B2 has been upgraded from 492 to 493c. This version
  should have corrected several bugs of 492. Should you discovery more bugs
  please fill out a SOFTWARE BUG FORM from CMP note #32 and post in note 32.


                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          BF        04/16/96        6.29
CMP.A2         B       WEEKLY          BF        04/14/96        8.27          
                                                                            
CMP.B1         D       WEEKLY          LS        04/17/96       18.31       
CMP.B2         D       MONTHLY                   INCOMPLETE
CMP.B3                                                                 

CMP_SCRUB.A1                                                                
CMP_SCRUB.A2   D       WEEKLY          LS        04/16/96       39.27
    
================================================================================
                               
 
63.81CMP PDSTRATA::TDYERThu Apr 18 1996 18:0123
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: April 17th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: 	                    	       Ext:  5072  
         	                               Node: Scoman::Tdyer
                                     
==============================================================================
SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                     
 Scrub.a2 - New upper arm will be in tomorrow.

 CMP.B2 - Software has been reverted back to 492, the 493 software had a delay
          in the handler routine, SF to address.
        - The monthly PM will be pushed out to next week, perform a weekly in
          place.

63.82C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Apr 18 1996 20:3738
                   CMP Equipment Engeering Passdown for:
                         18-APR-1996 19:31:50.11

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP-SCRUB. PM            


================================================================================

DOWN EQUIPMENT:

 Scrub.a2 - New upper arm will be in tomorrow.

 CMP.B2 - Software has been reverted back to 492, the 493 software had a delay
          in the handler routine, SF to address.
        - The monthly PM will be pushed out to next week, perform a weekly in
          place.
                                                                 TD

                          PM SCHEDULE FOR WW36
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          BF        04/16/96        6.29
CMP.A2         B       WEEKLY          BF        04/14/96        8.27          
                                                                            
CMP.B1         D       WEEKLY          LS        04/17/96       18.31       
CMP.B2         D       MONTHLY                   INCOMPLETE
CMP.B3                                                                 

CMP_SCRUB.A1   C       WEEKLY         BW/JS      04/18/96       37.29    
CMP_SCRUB.A2   D       WEEKLY          LS        04/16/96       39.27
    
================================================================================

63.83CMP PDSTRATA::TDYERFri Apr 19 1996 09:3728
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: April 19th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: 	                    	       Ext:  5072  
         	                               Node: Scoman::Tdyer
                                     
==============================================================================
SUBJECT: FAB6 CMP PM CHECK SHEETS
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                                 
  Please pull blank CMP.B PM check sheets from note 16 for ALL CMPB tools.
  These are the ONLY approved current rev check sheets.

  Also, I have added a note (#45) for in-complete PMs. IF you have started a
  PM and have not finished by shifts end, post your partially complete check
  sheet in note 45. The relieving shift will pull your sheet from note 45,
  complete the PM and post under the tool specific note.

  These procedures are ISO9000 correct, we have used them for the past 3 years 
  in FAB4, they work well and keep us in compliance. 


63.84C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Apr 19 1996 20:4638
                   CMP Equipment Engeering Passdown for:
                         19-APR-1996 19:40:04.64

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

DOWN EQUIPMENT:

CMP.B2 - Down for wafers not found on carriers 1-5. There was 26 inches of 
	 mercury at the main vacuum and 24 at the carriers.  The digital inputs
	 were checked and vacuum was being detected at all of the switches. 
	 The vacuum switches at the carriers were detecting vacuum at 22 inch.
	 The pump could not draw the vacuum down that far before the system
	 sampled for vacuum.  This was giving the error.  All of the switches
	 for each carrier were adjusted to sense at 20 inches of mercury.  The 
	 tool was returned to production with no further problems.

                                   PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          BF        04/16/96        6.29
CMP.A2         B       WEEKLY          BF        04/14/96        8.27          
                                                                            
CMP.B1         D       WEEKLY          LS        04/17/96       18.31       
CMP.B2         D       WEEKLY          LS        04/19/96       20.24
CMP.B3                                                                 

CMP_SCRUB.A1   C       WEEKLY         BW/JS      04/18/96       37.29    
CMP_SCRUB.A2   D       WEEKLY          LS        04/16/96       39.27
    
================================================================================

63.85C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Apr 20 1996 20:3936
                   CMP Equipment Engeering Passdown for:
                         20-APR-1996 19:33:50.56

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

DOWN EQUIPMENT:


         
                                  NO ISSUES



                                 PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          BF        04/16/96        6.29
CMP.A2         B       WEEKLY          BF        04/14/96        8.27          
                                                                            
CMP.B1         D       WEEKLY          LS        04/17/96       18.31       
CMP.B2         D       WEEKLY          LS        04/19/96       20.24
CMP.B3                                                                 

CMP_SCRUB.A1   C       WEEKLY         BW/JS      04/18/96       37.29    
CMP_SCRUB.A2   D       WEEKLY          LS        04/16/96       39.27
    
================================================================================

63.86C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Apr 25 1996 21:1142
                   CMP Equipment Engeering Passdown for:
                         25-APR-1996 20:05:24.30

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A1     VERIFY-U      
CMP.B1     UNSCHED_DOWN  


================================================================================

DOWN EQUIPMENT:

CMP.B1 - Down for slipping wafers from the previous shift.  Pad was changed and 
	 the tool was cleaned up.  The alignments were checked and the index 
	 table and all carriers were adjusted.  The tool slipped another wafer 
	 at lift of but no wafers were broke.  The reps. suspected that there
	 was a problem w/ the pads, so they tried breaking the pad in using a
	 modified conditioning recipe.  Fifty wafers were run and It seemed to 
	 have worked.  While running MQCs 2 wafers came out of heads 1&5.
	 inverter errors were recieved and the screen locked up all at once.
	 The tool presently sets rebooted with all wafers off the system in wet
	 idle.
     
                                 PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                 MONTHLY                                          
CMP.A2         A       WEEKLY          BF        04/22/96                 
                                                                            
CMP.B1         D       WEEKLY          TL        04/24/96       18.32       
CMP.B2                 WEEKLY        
CMP.B3                                                                 

CMP_SCRUB.A1   D       WEEKLY          LS        04/24/96       37.30    
CMP_SCRUB.A2   D       WEEKLY          LS        04/24/96       39.28
    
================================================================================

63.87C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALWed May 01 1996 20:4644
                   CMP Equipment Engeering Passdown for:
                          1-MAY-1996 19:40:05.61

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down



================================================================================

DOWN EQUIPMENT:
                
CMP.A1 - Down for a leaking slurry line on pump #1 and a DI water leaking from 
	 the spray nozzle.  Replaced the slurry line and repaired the DI
	 nozzle.

CMP.B3 - FYI.  Process chilled water and DI are turned on.

CMP.B1 - Tool had scratches earlier today on the wafer that was in head #5.
 	 The primary polish area was cleaned up the index table was drained and
	 wiped out.  The load/unload cups were checked for contamination, none
	 found.  The water tracks were also cleaned out.  The MQCs were
	 rechecked and the particle problem got worse the tool was given
	 another quick wiped down but there is no time for process to recheck
	 the MQCs.  Tim asked that if the tool fails again that the pad be
	 changed.
                
                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          TL        04/28/96        6.31       
CMP.A2         A       WEEKLY          TL        04/30/96        8.29                                                                               
CMP.B1         D       MONTHLY         BJ        05/01/96       18.33       
CMP.B2                 WEEKLY
                                                                        
CMP_SCRUB.A1   B       WEEKLY          RP        04/29/96       37.31    
CMP_SCRUB.A2   D       WEEKLY          BJ        04/30/96       39.29
    
================================================================================

63.88C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu May 02 1996 20:5332
                   CMP Equipment Engeering Passdown for:
                          2-MAY-1996 19:46:07.42

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

DOWN EQUIPMENT:
                
CMP.B1 - Down for scratches.  The problem was evaluated by engineering and it
	 was determined that the scratches were actually slurry residue .  
	 Process engineering decided to return the tool to production.         
     
                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          TL        04/28/96        6.31       
CMP.A2         A       WEEKLY          TL        04/30/96        8.29                                                                               
CMP.B1         D       MONTHLY         BJ        05/01/96       18.33       
CMP.B2                 WEEKLY
                                                                        
CMP_SCRUB.A1   B       WEEKLY          RP        04/29/96       37.31    
CMP_SCRUB.A2   D       WEEKLY          BJ        04/30/96       39.29
    
================================================================================

63.89CMP PDSTRATA::TDYERFri May 03 1996 17:4764
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: May 3rd 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: Dennis Goodwin 	               Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN WHILE I'M OUT.
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++


 *** DO NOT TOUCH ANY OF THE MAIN SLURRY VALVES UNDER THE FLOOR WITH OUT
     CONTACTING MYSELF OR ASHALN CHEM. THE BACK PRESSURE HAS BEEN SET UP TO 
     MEET CMP.B3'S NEEDS. WE ARE ON THE EDGE OF STALING THE PUMP AND NOT 
     REACHING B3. ***

CMP.B1 - Running. 
         What were thought to be scratches were noted today, they were
         actually slurry particles. Should this come up again, the particles
         should be ZOOMED in on the SS. Pro Eng is going to put pictures in the
         FAB of "slurry" particles which appear to be scratches. MFG and the
         PSS should zoom in on the SS or review the wafer under a scope.
         
CMP.B2 - Down for vacuum errors and debugging 493c. There is a leak on one of the
         heads or carriers, this must be fixed first. Also the vacuum pump
         needs to be rebuild, it's quite gummed. After the vacuum problem is
         fixed, Alan will investigate 493c problems, until MFG needs the tool 
         back.
 
The Speedfam software Engineer will be in again tomorrow morning. The plan is
to get on B1 or B2 in the morning and than the other polisher in the afternoon.
On B2 he will be debugging 493c, on B1 he will be verifying that 493c works
Ok on this system. B1 will be RELEASED with 491 and B2 with 492 until I get
back.

                              
CMP.B3 -  Doc is working on the Start-up of B3. He is here today and will be 
 in next week. If there are items which can be passed on to the night shifts,
Doc will do so. At this time most of the work is being done by the reps during
8-5. Currently the system has cycled wafers through load and un-load with out
any problems. They will begin cycling through the carriers heads late today or
Monday. If the reps get to a point where they are done testing the system, 
Doc will start the 500 wafer mechanical acceptance. The wafers are in the 
room marked with my name. They are allowed 2 assist, no failures. Use the 
following recipes;       Run 50 wafers on NOTOUCH
			     50 wafers on touch_80
			     50 wafers on touch_250
			     50 wafers on touch_375
			     50 wafers on io_mqc
			     50 wafers on io_410
                             the rest on touch_80.

  There is only ONE 2nd table pad for B3, it is in the cabinet under process 
 eng. I ordered 50 more 2nd table pads two weeks ago.....waiting on the 
 pads.

   
63.90C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri May 03 1996 20:4365
                   CMP Equipment Engeering Passdown for:
                          3-MAY-1996 19:36:44.98

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B2     SCHED_DOWN    


================================================================================

DOWN EQUIPMENT:

CMP.B3 - Reps. continued to working to get the tool ready for digital's
	 mechanical and process exceptance.  Handling alignments were verifed 
	 by running a boat of wafers.  Minor adjustments were also made to
	 various flows.  

CMP.B2 -

      First thing this morning, the system broke a wafer on the polish
      table.  The wafer was from head #4, segment unknown.  Both tables
      got new pads and the multihead was fitted with 5 new carriers.  The
      system also received a thourough clean prior to installing above
      items.

      Carrier to cup alignments were performed on all five heads.  All five
      heads were good.  Head #4 was a bit less than perfect, but still
      within it's acceptabilty.  

      After normal pad break-in procedures (conditioning and B_IN recipes),
      the system rested awhile.  At this time, SPEED493C was loaded into
      the computer.  The system was run to check/confirm it's performance.
      Vacuum errors began to pop up at this time.  They were random in that
      the errors occurred on different heads at different times.  Covers 
      were removed to check the vacuum gauges.  Each time the system checked
      and reported what carrier was the problem, the vacuum gauge confirmed
      it to be actually low (usually between the 15-20 " Hg range).  The 
      wafers appear to be in the carrier extension ring fine each time.

      Checked the vacuum line from the pump to the MHTA, a collapsed line 
      was found at the bulkhead junction located under the flextrack on
      pump side of the system (where the black line mates with the clear
      line).  The black line was the collapsed side.  This allowed the
      vacuum gauge at the pump to read very good, but the gauges at the
      head to be substantially lowerer (8-12 " Hg).  It was cut back to
      elinimate the collapsed section.  Testing is currently going on. 

     
                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          TL        04/28/96        6.31       
CMP.A2         A       WEEKLY          TL        04/30/96        8.29      
                             
CMP.B1         D       MONTHLY         BJ        05/01/96       18.33       
CMP.B2         D       WEEKLY          BJ        05/01/96       20.26
                                                                        
CMP_SCRUB.A1   B       WEEKLY          RP        04/29/96       37.31    
CMP_SCRUB.A2   D       WEEKLY          BJ        04/30/96       39.29
    
================================================================================

63.91C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat May 04 1996 20:2138
                   CMP Equipment Engeering Passdown for:
                          4-MAY-1996 19:16:00.14

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

DOWN EQUIPMENT:

CMP.A2 - Down for a slurrry leak.  Pump #1 slurry line had a crack in it.  
	 Removed and cleaned both pump heads and replaced the lines.  Tool
	 was returned to production.

CMP.B3 - Reps continue with there installation checks and alignments.  The down
	 force for the carriers and the conditioner were calibrated.  Final
	 platen run out was noted.  Pressures and flows were also checked
	 and corrected as needed.  A pad was also put on as requested by
	 SPEEDFAM.

                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1         A       WEEKLY          TL        04/28/96        6.31       
CMP.A2         A       WEEKLY          TL        04/30/96        8.29      
                             
CMP.B1         D       MONTHLY         BJ        05/01/96       18.33       
CMP.B2         D       WEEKLY          BJ        05/01/96       20.26
                                                                        
CMP_SCRUB.A1   B       WEEKLY          RP        04/29/96       37.31    
CMP_SCRUB.A2   D       WEEKLY          BJ        04/30/96       39.29
    
================================================================================

63.92CMP PDSTRATA::TDYERThu May 09 1996 17:3157
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: May 9th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: Dennis Goodwin 	               Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN and CMP.B3 update.
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 *** Today we noticed that the slurry pressure gauge on B3 would go to ZERO
     every 30 seconds for 5 seconds. Contacted Ashland and requested they 
     swap pumps, problem went away. Ashlan Chem will address the problem, ie
     change the pump.

 *** DO NOT TOUCH ANY OF THE MAIN SLURRY VALVES UNDER THE FLOOR WITH OUT
     CONTACTING MYSELF OR ASHLAN CHEM. THE BACK PRESSURE HAS BEEN SET UP TO 
     MEET CMP.B3'S NEEDS. ***
     
CMP.B1 - Up. 

CMP.B2 - Down for Unload flipper errors and CRASH. JP and SF adjusted sensors
         on the unload flipper. During testing 3 wafers came out at TOUCH DOWN,
         There were 10 wafers on the pad...double load, needs pad change.
                              
CMP.B3 - INSTALLATION and EQUIPMENT START UP are complete. We have started the
         EQUIPMENT ACCEPTANCE portion (500 wafer marathon). The marathon will
         continue into the night until the SF reps leave and will resume in 
         the morning. One DEC EEG tech must work with the reps to monitor 
         assist and or failures. I have allowed for 3 assist and no failures. 
         If a wafer STICKS to the pad during LIFT OFF (only) this can be 
         counted as an assist. Currently we have ONE assist logged, (wafer 
         stuck at lift off), this allows for TWO more possible assist. 
       
         wafer count	assist		failures    recipe
            50		  1		   0        IO_MQC, IO_410, Bin1,2,3
           100		  0		   0        IO_bin1 
	   150                                      IO_bin1 
           200                                      IO_bin1 
           250                                      IO_bin1 
           300                                      IO_bin1 
           350                                      IO_bin1 
           400                                      IO_bin1 
           450                                      IO_bin1 
           500	                                    IO_bin1 

  There is only ONE 2nd table pad for B3, it is on the tool. More pads are
  due in tomorrow.

   
63.93CMP PDSTRATA::TDYERFri May 10 1996 17:1937
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: CMP.dis		               Date: May 10th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: Dennis Goodwin 	               Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN and CMP.B3 update.
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

 *** DO NOT TOUCH ANY OF THE MAIN SLURRY VALVES UNDER THE FLOOR WITH OUT
     CONTACTING MYSELF OR ASHLAN CHEM. THE BACK PRESSURE HAS BEEN SET UP TO 
     MEET CMP.B3'S NEEDS. ***
     
CMP.B1 - Up, 493c installed, tested and released to MFG. 

CMP.B2 - Up. Wafer stuck to pad today at lift off and slammed into an other
	 carrier.
                      
CMP.B3 - In start up. Wafer count reset this morning after the elevator dump
         valve failure. Current count is 250 with no failures and one assist
         due to the cassette not being placed properly. John S. will be
	 monitoring the progress of the marathon. Please call me with an
         update after the reps leave for the night, upon completion tomorrow
         and if there is a FAILURE. thanks.
                           
  There is only ONE 2nd table pad for B3, it is on the tool. The pads did
  NOT arrive.

   
63.94CMP PDSTRATA::TDYERFri May 24 1996 15:4641
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: May 24th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: Jim Tooker 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.2 - DOWN for loading problems. Load cup and shuttle are lost.

 CMP.B1 - DOWN for head rotation errors. Once any one of the heads fail to
          rotate, the other heads will be turned OFF and the system will error
          for "head-1 not rot, head-2 not rot, head-3, etc". So, please isolate
          which head is actually failing for rotation. If necessary, run with
          one head on-line at a time and run with 400lbs of df. Once the head
          is isolated, troubleshoot, it may require replacing the infranor.

 WEEKEND PASSDOWN FOR FAB6.

 SHOULD CMP.B2 ERROR FOR VACUUM, REPLACE THE VACUUM TANK POPET AND CHECK VALVE.
 THE HARDWARE IS LOCATED IN THE 3RD DRAW IN THE SPEEDFAM OFFICE. IF B2 DOES 
 NOT FAIL OVER THE WEEKEND, PLEASE REPLACE THESE COMPONENTS AT START UP
 (MICH, BOB G.)

 SHOULD B1 REQUIRE MORE INFRANORS, PAGE THE REPS LONG RANGE, THEY HAVE SOME
 AT PACKAGING PLUS I THE SHAW'S PLAZA.
 
 I CAN BE REACHED AT HOME THIS WEEKEND. (I may however be participating in 
 the annual memorial day weekend beverages) 

 
63.95CMP PDSTRATA::TDYERThu May 30 1996 17:2833
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: May 30th 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.1 - UP, conditioner repaired today.

 CMP.B1 - UP, at MQC. Head-1 is OFF LINE.
          The motor cables were swapped at the bulkhead plate with no change. 
          When motor cables for head 1 and 5 were swapped at the MHA terminal
          board, the problem moved to head-5 (head-5 stalled).  The flex track 
          motor cable for HEAD-1 is broke. The new cables are due in tomorrow.

 CMP.B2 - Up, new pad installed.

 CMP-Scrub.a2 - Up with warning, monitor the loader. Load elevator was rigged
          until the correct parts arrive tomorrow.
 
 CMP-Scrub.a2 - UP, lower outside motor brush motor replaced today.

63.96CMP PDSTRATA::TDYERFri May 31 1996 17:0435
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: May 31st 1996
         		                       From: Timothy P. Dyer
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.1 - DOWN, PM. The alignments have been completed (with in 0 -.002"). The
          system needs to be put back together and PM finished up.

 WSTK.2 - UP

 CMP.B1 - DOWN - Replacing cable for head-1. Please give me a ring around
          10:00pm ish with an update or with questions. 

 CMP.B2 - Up.

 CMP.B3 - Idle.

 CMP-Scrub.a2 - Up with warning, monitor the loader. Load elevator was rigged
          Once stock room unit is repaired, pick up parts under my name
          and install, also pick up remaining parts tomorrow from security
          tomorrow.

63.97CMP PD WSTK USERS TAKE NOTESTRATA::TDYERTue Jun 04 1996 18:1758
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: June 4th 1996
         Jim Scott   		               From: Timothy P. Dyer
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.1 - DOWN: Low polish rates, with high unif ie slow edge rate.
          Low rates could be caused by; BAD PAD, BAD SLURRY (low solids),
          LOW DOWN FORCE, CAM FOLLOWER SET UP (restrict downward stroke),
          LOW CARRIER SPEED, LOW TABLE SPEEDS, CONDITIONER WORN, CONDITIONER DOWN
          FORCE, INCORRECT SHAFT HEIGHT, LOW SLURRY FLOW, BAD WAFERS (reclaim),
          BAD CARRIER (uniformity so bad that it throws out the mean).
        	- Slurry solids OK because WSTK.2 rates are good
		- Down force was checked OK
        	- Cam follower OK
        	- Carrier and table speed OK
        	- Conditioner down force, diamond plate and set up OK
 		- Shaft height OK
		- Slurry flow OK
       	  	- Wafers are good.
		- Carrier ring height was in spec.
          We replaced the pad with a standard hand stack pad, and set
	  conditioner DF to 18psi. A known GOOD carrier  (#868) from  
          WSTK.2 was also installed on WSTK.1. Prior to replacing the pad
          with a standard, and the carrier with 868, the removal rate was;
          RR 680, edge 15%, unif 18%. After replacing the pad and carrier
          the rate increased to 1050, edge still high at 15 and unif still
          high at +25.  A reduction in carrier curvature should reduce the
          center to edge uniformity.

      PLAN FOR TONIGHT, CALL ME WITH RESULTS 699-4905.
  	  1) Build carrier 868 with 20u base plate,
          2) Install on WSTK.1, run 15 break ins and re-check.

 WSTK.2 - UP

 CMP.B1 - UP - Head-1 rotation errors may still intermittent, will be looked at
          after B2 comes up.

 CMP.B2 - Down - Main water line in flex track ruptured today, parts due in
          tomorrow.
                  
 CMP.B3 - Main table motor and gear box assy (850lbs) pulled and replaced 
          today. The unit will be re-connected and plumbing re-installed 
          tomorrow. Good job by the Speedfam reps and Hollamar!

63.98CMP PDSTRATA::TDYERMon Jun 24 1996 17:5638
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 24th 1996
         Jim Scott   		               From: Timothy P. Dyer
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.1 - A pad change was also required today after only ~150 wafers.

 WSTK.2 - Unif was at -6% after only ~150 wafers. Installed a F6 machine
	  stacked pad, unif was +30%! Pad had bubble replaced with an other
          machine stacked pad, same results. Installed a new lot of suba-iv
          (6fv-da6) and an ic1000 (6av-re3). Ran 10 minutes of conditioning
          at 8 break in wafers, unif came in at +3% 1100a/m. If unif drops out
	  tonight please run 10 minutes of manual conditioning with conditioner
          down force set to 1.5psi. Please return the idle recipe back to
          45sec and .5 psi and save when down. If the unif and rate does not
          recover after the conditioning, a pad change may be required...again. 
          If the 10 minute conditioning does recover the PR and unif, tomorrow
          we will look closer at RPC-II calibration and condition process 
          optimization.

 CMP.B1 - UP
 CMP.B2 - up      
 CMP.B3 - up. Failed for particles today, the tool was THOROUGHLY cleaned and
          everything came in spec. ID/OD was also adjusted for better unif.

63.99CMP PDSTRATA::TDYERTue Jun 25 1996 17:4048
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 25th 1996
         Jim Scott   		               From: Timothy P. Dyer
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 SUBJECT: CMP PASSDOWN
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
                      

 WSTK.1 - UP. IF UNIF DROPS OUT, INSTALL AN OTHER HAND STACKED PAD.

 WSTK.2 - UP. If unif drops out we need to run some test to help understand
          the PAD problems and possible come up with some relief. RUN MFG
          WIP ON WSTK.1 DURRING WSTK.2 TESTING.  Currently 
          the hand stack pads start with unif at the UCL (+15) and after only 
          ~150 wafers, end up at the LCU (-5%). When a machine stack pad is 
          installed unif is much too high at ~35% center fast. So, if, no, make
          that when the current pad on WSTK.2 fails do the following:

            1) install a MACHINE stacked pad.
            2) Run 25 wafers check unif, if above UCL goto 3, if under LCL,
               replace with a hand stacked.
            3) Run 25 wafers check unif, if under LCL, abort test and install
               hand pad. If unif is anywhere  above -5% continue the testing
               process, 25, retest, 25 retest, etc.

           This testing will collect data and help us to understand where the
           machine stack pads level off at.....Do they level off in spec,
           between +15 and -5% ?  Thanks for your help.

 CMP.B1 - UP
 CMP.B2 - up      
 CMP.B3 - up.

   FAB6 SLURRY SYSTEM was taken down at 11:00am for a tank modification. The
   work was completed and back online by 1:30pm! Ashland Chem will be performing
   twice a day purges, these should be transparent to the CMP tools.


63.100CMP PDSTRATA::TDYERTue Jul 09 1996 17:5953
    +---+---+---+---+---+---+---+
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 9th 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PASSDOWN
==============================================================================

 WSTK.1 - 8" Conversion complete, cycling wafers.

 WSTK.2 -  Start with a 20u carrier when a MACHINE STACKED pad is installed.
           Start with a 30u carrier when a HAND STACKED pad is installed.

 CMP.B1 - Index table upgrade in progress. Infranor replaced, table rotates 
          smoothly.
          Get detailed passdown from Doc and Reps. Please verify ALL leaks
          are fixed, spray undertable area basin with lots of water, check
          inside main frame for leaks.

 CMP.B2 - UP
          1 wafer broke on CMP.B2.  Wafer slipped out of carrier 3 on low 
          downforce recipe w/no vacuum on.  
      - Clean the mess on B2.
      - Change pad & carrier 3.
      - Breakin w/B3's conditioner ring and perform std MQCs.
      - If MQCs are in spec run it.
      - If MQCs show high removal rate call Frank at home 508-865-9220.
 
On ALL CMPB tools:
Eric  - Change all "low-downforce-1-second-recipes" so vacuum NEVER shuts off
      	on ALL speedfams...ie anything less than 377 lbs for 1 second.

 CMP.B3 - Removal rate was high out of spec(~3450A/min; spec 
      	   UCL=3400A/min).  The tool has been running high for some time. 
    Plan:
      - Switch the conditioner rings between B2&B3.
      - Run 10 breakins followed by MQCs on B3.
      - If removal rate drops in spec run it this way.
      - If removal rate is still high; EE perform downforce calibration on
      	all heads and condition (record old and new data). Repeat MQCs.

   Call Frank after 7:30 if you have any questions, i can also be reached at
   home if you need something.

63.101CMP PDSTRATA::TDYERWed Jul 10 1996 18:3448
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 10th 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PASSDOWN
==============================================================================
          
 WSTK.2 - 3 lots will be split TONIGHT for the evaluation of the ID/OD process.
        - IT IS VERY IMPORTANT THAT ALL THREE 1/2 LOTS BE COMPLETED BY 8:00AM.
          DO NOT PROCESS ANY OTHER MATERIAL TONIGHT. DAVE ENMAN SUPPORTS
          THIS WORK.
          MFG will run the EVEN portion of ALL three lots on the standard
          process. Treat these 3 HALF lots as whole lots, with pilots, dip,
          nitride readings etc. Leave completed lots in WSTK room for Eng.
          Hold the ODD portion for ENG, they will be processed in the morning.
       - Do NOT remove the current pad on WSTK.2. If the unif fails tonight
         during these lots, give me a call. 
       	                     
                              lots
         04 0335 STI CMP    B52834-01   24 DC0275-KA Prod 0710
	 04 0335 STI CMP    B52836-01   24 DC0275-KA Prod 0710
	 04 0335 STI CMP    B52838-01   24 DC0275-KA Prod 0710


 CMP.B1 - Index table upgrade in progress. There are still leaks from the table
          area. Troubleshoot as follows:
	        - Turn all water off in INDEX table area and dry.
                - Pour or spray water individually around each pedestal station.
                  Use wipes to isolate as a dam if required.
                - Wait several minutes and check inside system, if no
                  leaks move onto next pedestal station.
                * Repair as required.

 CMP.B2 - Remove conditioner and put BACK onto CMP.B3. Install the new spare
          conditioner (in the pad cabinet) onto CMP.B2

 CMP.B3 - BEFORE evening MQCs, check, record and calibrate all 5 head's DF.

63.102CMP PDSTRATA::TDYERWed Jul 10 1996 18:4062
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    | d | i | g | i | t | a | l |	  
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 10th 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PASSDOWN
==============================================================================
          
 WSTK.2 - 3 lots will be split TONIGHT for the evaluation of the ID/OD process.
        - IT IS VERY IMPORTANT THAT ALL THREE 1/2 LOTS BE COMPLETED BY 8:00AM.
          DO NOT PROCESS ANY OTHER MATERIAL TONIGHT. DAVE ENMAN SUPPORTS
          THIS WORK.
          MFG will run the EVEN portion of ALL three lots on the standard
          process. Treat these 3 HALF lots as whole lots, with pilots, dip,
          nitride readings etc. Leave completed lots in WSTK room for Eng.
          Hold the ODD portion for ENG, they will be processed in the morning.
       - Do NOT remove the current pad on WSTK.2. If the unif fails tonight
         during these lots, give me a call. 
       	                     
                              lots
         04 0335 STI CMP    B52834-01   24 DC0275-KA Prod 0710
	 04 0335 STI CMP    B52836-01   24 DC0275-KA Prod 0710
	 04 0335 STI CMP    B52838-01   24 DC0275-KA Prod 0710


 CMP.B1 - Index table upgrade in progress. There are still leaks from the table
          area. Troubleshoot as follows:
	        - Turn all water off in INDEX table area and dry.
                - Pour or spray water individually around each pedestal station.
                  Use wipes to isolate as a dam if required.
                - Wait several minutes and check inside system, if no
                  leaks move onto next pedestal station.
                * Repair as required.

 CMP.B2/CMP.B3 plan:

Please perform the following tonight on CMP.B2 and CMP.B3 to help us better
understand the removal-rate and pad cut-rate performance w/new vs. old 
conditoners and B2 vs. B3.

      - Calibrate DF on all fives heads on CMP.B3
      - On CMP.B2 and CMP.B3 perform MQCs, however, run 10 oxide breakin wafers
      	followied by 5 pre-measured oxide wafers.
      - Record results.
      - Remove CMP.B3's conditoner and place it in the cabinet labled 
      	"used blocky ring".
      - Remove CMP.B2's conditioner ring and place it on CMP.B3.  
      - Install a new blocky conditioner ring on CMP.B2.
      - On both CMP.B2 and CMP.B3 perform MQCs...run 10 oxide breakin wafers
      	followied by 5 pre-measured oxide wafers.
      - Record results...if all is in spec run product.  If anything
      	is out of spec call Frank at home.

63.103CMP PDSTRATA::TDYERThu Jul 11 1996 20:50108
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 11th 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PASSDOWN
==============================================================================

 WSTK.2 - SPLIT LOT STATUS:  (system at PRO until splits are finished)
          
          Last night the standard 1/2 of b52834-01 was processed.
          This morning we stared ID/OD process characterization and
          optimization. See data below. The monitor marathon was
          completed at 5:30pm and the 1st of the NON-STANDARD lots was
          then started. The non-standard lots will be finished tonight,  
          followed by a PAD CHANGE and then the standard portion.
          Please perform 100% nitride readings on ALL wafers, then randomize
          the lots before moving to next operation.

        SPLIT LOT NON-STANDARD PORTION (odd wafers) INSTRUCTIONS: 
         1) Process odd portion on recipe "TIM_CMOS5" on ID/OD pad.
         *****************************************************************
         *** USE 1.15 AS MULTIPLICATION FACTOR FOR NON-STANDARD WAFERS ***
         *****************************************************************
         2) If ending monitor uniformity is below -2.0 or above +9% an ID/OD 
            adjustment will be required. The current setting for OSCILLATION 
            RANGE is 20mm, change this to 25mm, or 30mm to make uniformity more 
            POSITIVE or decrease to 10mm or 15mm to make uniformity more 
            NEGATIVE. (THIS IS THE BEAUTY OF THE ID/OD PROCESS.) Recheck polish 
            rate uniformity and continue with next lot if in the above limits.
                              lots
         04 0335 STI CMP    B52834-01   24 DC0275-KA Prod 0710  *HOT LOT*
	 04 0335 STI CMP    B52836-01   24 DC0275-KA Prod 0710
	 04 0335 STI CMP    B52838-01   24 DC0275-KA Prod 0710

////////////////////////////////////////////////////////////////////////////////
                              DATA
     ID/OD RECIPE

DOWN FORCE =    7.0 psi
CARRIER SPEED = 23
PLATEN SPEED =  23 
CENTER POLISH  165mm
OSCILLATION =    20mm  (ADJUSTABLE PARAMETER)
OSC RATE =      10mm/s
CONDITION PSI =  1.0psi
CONDITION TIME =  35sec

 
RATE	UNIF	EDG	OSC/RATE
1010	-3	2	STD, WHOLE PAD
cut pad, to ID = 8.0", OD = 21.0"
1203	4.4	7	5/5  ID/OD
ran 10 warm ups.
1179	-1.4	10	5/5
run 3 breakins		10/5
1186	-1.9	6	10/5
run 3 breakins		10/5  (pol lim = 4536 to 5252)
1143	-5	13	10/5			10/5
run 3 breakins		20/10 (change polish pos to 170mm) to center ID/OD 
1163	-4	8.7	20/10
run 1 breakin		30/10
1162	-5	14	30/10
run 1 breakin		30/10 (change pol pos to 180) to center ID/OD 
1140	3.4	7	30/10 (pol pos = 180)
ran 1 breakin		40/10 (pol pos = 185)  to center ID/OD 
1143	-3	9.6	40/10
run 1 breakin		30/10 (pol pos = 180)
1145	-4	5.7	30/10
put 30u carrier (420) on system
ran 3 breakins		10/5  (pol pos = 165)
778	12.9	12	10/5
802	10	9	30/10 (pol pos = 180)
20u carrier installed
1201	30	10	60/10 (put pol pos to a fixed setting 165)
1164	24	8	60/10
1201	26	5	50/10
1154	12	11	40/10
1185	7.5	2.4	30/10
1196	4	13	20/10
985	8.6	10	std recipe (6.1psi, 5/2)
1216	7	6	10/10
1240	5	9	10/10
1193	8	8	15/10
1213	11	8	20/10
1179	5.6	10	20/10
start monitor marathon pad count at this time = 70
pr,4,pr,4,pr,4,pr,4,pr,4,pr       20/10
1050	15.6	6	20/10
1191	5.0	15.1	20/10
1182	5.5	12.5	20/10
1199	6.0	8.7	20/10
1133	6.6	8.7     20/10
1148	6.6	7.8	20/10
start ODD portion of b42834-01 HOT LOT, PILOT WAFER#15, REMAINING NIT =1352
decrease time by 8 seconds and changed factor to 1.5
continued lot.

63.104C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALThu Jul 18 1996 20:5737
                   CMP Equipment Engeering Passdown for:
                         18-JUL-1996 19:54:07.76

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

DOWN EQUIPMENT:

CMP.A1 - DOWN FOR PROBLEMS WITH UNIFORMITY AND PARTICLES.  THE CONSUMABLES
	 WERE SWAPPED OUT, AN O-RING OFF THE LEFT SPINDLE WAS REPLACED, THE 
	 LEFT SCRUB BRUSH ADJUSTED, AND THE TOOL WAS CLEANED UP AND RETURNED TO
	 PRODUCTION.  

CMP.B3 - DOWN FOR THE CARRIER #4 NOT ROTATING.  THE INFRANOR WAS REPLACED AND 
	 THE TOOL WAS RETURNED TO PRODUCTION. 

                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                                                                      
CMP.A2                                                                     
                             
CMP.B1                                                                      
CMP.B2        
CMP.B3                                                                  

CMP_SCRUB.A1                                                             
CMP_SCRUB.A2 
    
================================================================================

63.105C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Jul 20 1996 20:3550
                   CMP Equipment Engeering Passdown for:
                         20-JUL-1996 19:32:08.25

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.A2 - Down for high particles on the right carrier.  The particles were at 
	 3000.  Changed out the right brush and the particles came in at 1100. 
	 Returned the tool to production.
	  
CMP.B2 - Down for high particles.  The scrub brushes were not rotating.  The 
	 scrub assembly was pulled and the gear on the motor shaft was found 
	 to be stripped.  Some bearings are also bad and most of the screws 
	 were damaged.  The upper and lower scrub assemblies were swapped with 
	 CMP.B3's because it was down.  Speedfam has been notified and the
	 parts will be ordered.  The tool was cleaned up and returned to
	 production.

CMP.B3 - Down the carrier#1 not going down at 2nd table and wafers sliding out 
	 on the primary table (same head).  Believe that the EP regulator is
	 out of calibration.  Waited for most of the day to receive a 
	 procedure from SF.  A procedure was found in the SF office and 
	 followed.  The down force for head #1 will need to be done over.  The
	 tool presently sets at PART waiting for the upper and lower scrub
	 assemblies that were put on CMP.B2.  Speedfam has been notified about
	 the scrubber and they are ordering the appropriate parts.

                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                                                                      
CMP.A2                                                                     
                             
CMP.B1                                                                      
CMP.B2        
CMP.B3                                                                  

CMP_SCRUB.A1                                                             
CMP_SCRUB.A2 
    
================================================================================

63.106CMP PDSTRATA::TDYERThu Jul 25 1996 19:0549
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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        Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: July 25th 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PASSDOWN
==============================================================================

 WSTK.2 - UP

 CMP.B1 - Down. One of the door sensors tripped, this caused the system to
          continually polish the wafers until the problem was noticed.
          5 wafers from a hot lot have been scraped.
        - Doors have been fixed, currently running particle experiments.
        - See "particle update"
             
 CMP.B2 - UP, see "particle update"
             
 CMP.B3 - Original scrubber installed and scrubber continues to stall.
          Troubleshooting at this time.

 Speedfam particle update:
       - Problems were identified today. The incoming film thickness 
         on the monitors is low, this change effects the optimized target 
         on the surfscan possibly contributing to erroneous readings.
         Kyle is working with DRG to make 5k SS program.

       - The MQC wafers were inspected on a review station. The surfscan counts
         were 2500-3000, the inspection determine there to be at least a full
         magnitude less (~200-500). The particles detected by the surfscan have
         been false. This may be due to the FILM THICKNESS or FILM QUALITY.
         The Novelus folks are making up new 12k monitors. Also we 25 12k
         wafers being made u on the 5000s.
      
       - TONIGHT: RUN MQCs ON CMP.B3 AND B1 WITH 5 STANDARD 12K NOVELUS WAFERS
         AND 5 5000s 12K WAFERS, IF EITHER PASS THE SYSTEM CAN BE RUN. IF THEY
         FAIL CHECK WAFERS ON REVIEW STATION. IF THEY ARE FALSE PARTICLES
         THE SYSTEM CAN BE RUN.

       
63.107C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Jul 27 1996 20:4547
                   CMP Equipment Engeering Passdown for:
                         27-JUL-1996 19:42:51.40

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.A1     REPAIR        


================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.B1 - Down for high particles.  The tool was put to Process engineering
	 because it was determined on CMP.B2 that the particle problem was
	 not real.  The tool was later returned to production. 

CMP.B2 - Down for high particles.  All efforts to find the particle problem 
	 w/ the tool were exhausted.  The issue was handed over to process 
	 engineering.  Several MQCs failed for particles w/ MQC wafers that 
	 were generated from different tools (5000, novellus).  Later particles
	 were read from product wafers that were run on CMP.B2 & CMP.B3 both
	 were clean the tool was returned to production.

CMP.B3 - Down for a Pad change due to low removal rates.  Both pads were 
	 changed and the conditioner and process area were cleaned.  The 
	 particles came in but the removal rates are still low (1100). Run out
	 time.  


                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                                                                      
CMP.A2                                                                     
                             
CMP.B1                          All PMs completed.                         
CMP.B2        
CMP.B3                                                                  

CMP_SCRUB.A1                                                             
CMP_SCRUB.A2 
    
================================================================================

63.109C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Aug 03 1996 20:2147
                   CMP Equipment Engeering Passdown for:
                          3-AUG-1996 19:17:14.02

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B1     UNSCHED_DOWN  


================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.B1 - Down for high particles and install of new ball bearings in the
	 conditioner arm.  The tool never came up from the PM.  Pulled all the 
	 cups and cleaned the index table. Cleaned the conditioner and process
	 area.  Swapped out the pad with a prestamped one from stock.  The ball
	 bearings for the conditioner arm came in this morning and were
	 installed but we also need the seal which protects the bearings.  This
	 was never ordered.  Speedfam was notified about the seal and will 
	 order it ASAP.  Until the old seal was cleaned and reinstalled until
	 the new part arrives.  MQCs were run on the toolbut they failed for
	 high particles.  Process Engineering was contacted and they requested 
	 that a filter be placed inline with the tool and the pad changed again
	 and the MQCs repeated.  

CMP.B3 - Down for high particles.  Changed both pads. Cleaned the conditioner 
	 ring and process area up.  Scrubbed the carriers. Returned the tool to
	 production.  It passed MQCs.

                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                                                                      
CMP.A2                                                                     
                             
CMP.B1                          All PMs completed.                         
CMP.B2        
CMP.B3                                                                  

CMP_SCRUB.A1                                                             
CMP_SCRUB.A2 
    
================================================================================

63.110C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALWed Aug 07 1996 20:4047
                   CMP Equipment Engeering Passdown for:
                          7-AUG-1996 19:36:52.66

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP-SCRUB. UNSCHED_DOWN  
CMP.B1     UNSCHED_DOWN  


================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.B3 - Down for high particles.  The tool was at engineering most of the day.
	 Slurry was drawn directly out of a 55 gallon drum to eliminate the
	 slurry system.  The particles failed.  The pad was changed and MQCs 
	 rechecked.  The MQCs failed for particles again.  MQCs were checked 
	 using a recipe with an extended 2nd polish time but the tool still 
	 failed.  Please follow Engineering's action plan sent out by Krupa.

CMP.B1 - Down for high particles.  The issue was never addressed.

SCRB.1 - Down for problems with the spin station.

SCRB.3 - Down for errors for no wafer at the outside brush station.  The belts 
	 in the load station were off the pullies.  Corrected the same
	 rebooted and ran with no further problems.
 

                                PM SCHEDULE  
--------------------------------------------------------------------------------
 TOOL         SHIFT   TYPE PM DUE     TECH.   DATE COMPLETED    NOTE FILE #
--------------------------------------------------------------------------------

CMP.A1                                                                      
CMP.A2                                                                     
                             
CMP.B1                          All PMs completed.                         
CMP.B2        
CMP.B3                                                                  

CMP_SCRUB.A1                                                             
CMP_SCRUB.A2 
    
================================================================================

63.111CMP PDSTRATA::TDYERThu Aug 08 1996 18:2246
    +---+---+---+---+---+---+---+
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    +---+---+---+---+---+---+tm-+
     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 8th, 1996
         Jim Scott   		               From: Timothy P. Dyer		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PARTICLE
==============================================================================

  Particle update:

 The surfscan was calibrated today by DRG. They found no problems and made no
 changes to our recipes, we are reading the wafers correctly and have REAL
 particles. We have ruled out the following items; the WAFERS, the PAD, the
 BULK DELIVERY SYSTEM and the 3 ONTRACKs. We have details around this if 
 needed. Some other test run today:
 
 	test            		  delta particles (adders)
 
 120lbs/SLURRY/1S seg5	      	       +500 +500 +500 +500 +500
 80lbs/WATER/1s seg5 (same wafers)     -200 -245 -205 -250 -240
 scrubber/slurry dip test (3 wafers)          +52 +79 +69
    REPEAT			  	     -31 -19 -11
 slurry ph = 10.5	      
 slury soldis 12.5%

 Because the 80/DI polish removed 50% of the particles from the wafers we would
 like MQC run on recipe "EXT_80lbs" on B1. This recipe has an extended time in
 step 6 of 90 seconds. Should this pass particles, change the time to B2, B3 MQC
 recipe prior to running MQC. Should this be effective in removing the
 particles change ALL recipes (step-6) on ALL CMP.B tools.
 If this failed, connect a barrel to B1, mix the slurry with one pump and use a
 2nd pump to pump the slurry through the little blue 5u filters and to the sol
 valves (2). Should this pass particles, re-connect bulk system and verify that
 it fails again.  

 
 
63.112CMP PDSTRATA::TDYERFri Aug 09 1996 19:2969
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     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 9th, 1996
         Jim Scott   		               From: Timothy P. Dyer
						     Frank Krupa		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP PARTICLE
==============================================================================

  Particle update:

 Check specific gravity of DI, appeared to be OK at .94, PH of slurry was
 10.5 FAB4, 10.5 FAB6. Specific gravity of FAB6 slurry was 1.07.

 Test run today on B1:                   H-1  H-2  H-3  H-4  H-5
	- Slurry lift off 	=	4511,4652,4350,4360,3212
	- 377 DI rinse 15 sec	=	2295,2899,3916,2311,2360
	- 377 DI rinse 50 sec	=	                564  866
	- 377 DI rinse 50 sec	=	 908, 878, 874, 975, 978

 Test run on CMP.Scrub.A1:
	- Reinstalled spray manif   =  (run B1)   3916,2311,2360

 Test run on B3:
	- Slurry lift, slurry 2nd T =	1624        972,    1007
	- Water lift, slurry 2nd T  =	1039,       511      849
        - NH40H on 2nd T	    =   failed miserably
        - 377 DI rinse 50 sec	    =	1895,       2085,   1834 * (scratches)
            * filler dummies polished to bare si, tool vibrated in DI-377 step,
	      dropped wafer 4 at lift-off, repeated test.
        - 377 DI rinse 50 sec	    =	 714,        672,   1062(dropped)
        - FAB4 slurry, std MQC	    =    457,        258,    463	
        - FAB4 slurry, std MQC	    =    605,        908,    959

  SUMMARY:
   The 377 lbs DI water scrub step on the primary table removes enough of the
   particles to put the wafers back in spec. This is patch for the problem which
   may be implemented over the weekend. The FAB4 slurry test showed the best
   results with particle levels back down to about 400. 

 ACTION PLAN FOR WEEKEND/TEST:
   Collect two gallons of FAB4 slurry, unfiltered. Connect to CMP.B3 and run
   standard MQC. Two gl is only enough slurry for 5 warm ups and 5 MQC wafers!
   RECORD data in CMP.B3 notes file and in SPC. We can not make major changes 
   to the FAB6 slurry system tonight.  

   MFG PLAN: Change ALL recipes STEP 6, from 80lbs, 13 sec to 377lbs, 50s 
   (compare to "377_DI" on CMP.B3). Frank and I can be reached at home.

 *NOTE* DO NOT POLISH WAFERS TO BARE SI WITH 377_DI RECIPE, IT WILL BREAK
        WAFERS.

 *note* If B3 is dropping wafers at lift off change ID&OD to 131 in steps 8&9.
       
 CMP.B1 IS STAYING AT ENG
 SF PRO ENG and EEG (Marie and Dave) will be in tomorrow, to run several test
 CMP.B1, providing B2 and B3 are up. Any problems or question call Frank or I.


 
63.113C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Aug 09 1996 20:2331
                   CMP Equipment Engeering Passdown for:
                          9-AUG-1996 19:22:03.02

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down


================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.B3 - Down for high particles and testing by process engineering.  For the 
	 full passdown please refer to Tim Dyer's passdown.  Had some handling 
	 problems with the unload flipper manually exercised the flipper and no
	 further problems were experienced.  Started to follow engineering's 
	 particle get well plan.  Ran the test using the unfiltered fab4 
	 slurry.  The results were as follows:

                                PRE              POST
                          ---------------------------------
                          1. 13-37-0      |   343-1344-0
                          2. 11-35-0      |   272- 918-0
                          3.  6-34-0      |   333-1303-0


CMP.B2 - The monthly has been wavied until next week.

================================================================================

63.114CMP PDSTRATA::TDYERMon Aug 12 1996 18:5427
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     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 12th, 1996
         Jim Scott   		               From: Timothy P. Dyer
						     Frank Krupa		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP Passdown
==============================================================================

 FAB6 CMP room was shut down today at 12:30, back on line at 6:00pm. All
 tools will need MQCs. STEP 6 on the CMP.B tools should be 377lbs for 30 sec.
 All TOUCH UP recipes step 6 should match step 5 down force and time set to
 30sec. This should keep tools inside TDCO limits.

 More particle experiments will be run tomorrow.

 

63.115CMP PDSTRATA::TDYERTue Aug 13 1996 18:2444
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 13th, 1996
         Jim Scott   		               From: Timothy P. Dyer
						     Frank Krupa		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP Passdown
==============================================================================

 WSTK.2 - Down for vacuum errors. 
        : Check carrier wet time, make sure there is enough water sprayed onto
          the back of the wafer. Check vacuum on gauge, should sense wafer
          at ~15", adjust switch as required. If total vacuum is low, check
	  with out carrier, cap end of carrier shaft with hand and turn on 
          vacuum, gauge should hit 20". If not, check all hoses, replace SOFT
	  WATER filter.

 CMP.B systems: Particle problem continues to be relived by the DI step-6. 
         ALL recipes have been set up by Engineering, no changes are required
         tonight. THE POLISHERS SHOULD NOT VIBRATE, UNLESS WAFERS ARE POLISHED
	 TO BARE SILICON.....AVOID THIS!
         FYI, the recipes look as follows:

	RECIPE		 STEP-6

	IO_MQC		377lbs/30s/vac off
	BREAKIN#	 80lbs/13s/vac off
	IO_MQC		377lbs/30s/vac off
	ILD#		377lbs/30s/vac off
	PMD		377lbs/17s/vac off
	TOUCHUP#	377lbs/17s/vac off
        TUP###		80lbs/13s/vac ON

     # is a variable in the recipe name, ie A,B,1,2,3, etc.

63.116CMP PDSTRATA::TDYERWed Aug 14 1996 19:4137
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    | d | i | g | i | t | a | l |	  
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     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 14th, 1996
         Jim Scott   		               From: Timothy P. Dyer
						     Frank Krupa		
                                               Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP Passdown
==============================================================================

 CMP.B systems: Wafer breakage problem: Source of breakage attributed to the
         step-6 DI process, this problem becomes more prevalent with bare
         SI wafers but has also occurred on good oxide wafers. Step-6 has been
         modified. It is now two step (6,7) step 6 is at 10 seconds and 377,
         step 7 is at 20 seconds, 300 and VACUUM ON. Process tested on CMP.B2
         today. CMP.B2 and B3 recipe's have been modified. Please MATCH
	 CMP.B1's recipes to B2 or B3 before running breakins, MQC, etc. 
         If you have any questions regarding the recipes, call FRANK at home.

 CMP.B1- Software corrupted, hardware.cmp file indicated METALS tool.
         Needs recipe changes and MQCs.
 
 CMP.B2 - Crashed last night, recipes modified and tested, MQCs ALL in spec.

 CMP.B3 - Belt was skipping. Central pulley assy upper bolts were loss, idler
          assy shift and belts loosened......tightened same. Recipes modified
          needs MQCs.

 
63.117CMP PDSTRATA::TDYERThu Aug 22 1996 18:2737
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
     Semiconductor
					I N T E R O F F I C E   M E M O

     To: Dennis Goodwin		               Date: August 22th, 1996
         Jim Scott   		               From: Timothy P. Dyer
					       Dept: Engineering
     cc: CMP.dis 	                       Ext:  5072  
         		                       Node: Scoman::Tdyer
         
                            
==============================================================================
 CMP ENGINEERING PASSDOWN
==============================================================================
                 
 CMP.B1 - Still down for head rotation problems. During troubleshooting, the
	  CPU crashed. A new CPU and HARD DRIVE where installed, the system would
	  not boot. It appears the hard drive is NOT loaded with software.
          Before we can troubleshoot the head failure problem, the system 
          must be booted up and ALL software loaded. If this is successful 
	  tonight, run ROTGO before running any other test.  SPEEDFAM Phoenix 
	  has been notified of our situation, I have requested more help. 
	  Please call me at shift change with a status. For starters it would
	  help if the motor phase signals (A,V,W) matched the schematics. If
	  your unable to get the software working, trace UVW from the infranors
	  to the all 5 rotation motors. Note any discrepancies.

 CMP.B2 - Down for dropping wafers. Several wafers dropped from HEAD-5. The
	  carrier from 5 was swapped with 4. HEAD-% dropped a wafer with
	  carrier-4 installed. There is a leak in head-5's vacuum system,
	  fix same.


 

63.118C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Aug 24 1996 20:4780
                   CMP Equipment Engeering Passdown for:
                         24-AUG-1996 19:45:24.87

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B1     REPAIR        

================================================================================

CMP.B1-
    
    Head #1 rotation failure problem:
    --------------------------------
    It appears that the problem is with the analog control loop wiring
    for head #1's down force control. We have sucessfully run a full
    cassette of wafers at 377 lbs of down force. (IO_BKIN recipe)
    
    D shift removed and retightened every connection on terminal boards
    14,15, & 16 last night. They also removed and reconnected cable #2
    on the right side lower bulkhead . They sucessfully completed 1/2
    cassette of wafers and passed down to us this morning. We continued
    with a verification run and experienced a head #1 rotation error on
    the fourth run.  
    
    Richie from Speedfam arrived this morning with a new Analog I/O cable
    for cable #2 ( head #1's feedback cable). The cable was run outside
    the tool from the right bulkhead connector to terminal board #16 on
    the Multihead. We have just finished running a full cassette of 
    wafers at 377 lbs. of down force with NO head #1 rotation errors.
    However, head #5 slipped out a wafer near the end of segment 5 and
    it broke under carrier #4. We are now in the process of cleaning up
    and resuming the verification run. We will need to run at least 4
    cassettes of wafers before we're satisfied that we've got resolution
    on this problem.  
    
    This passdown is being sent out early because I'm leaving at 4:00 p.m.
    today. Check out Bradley's passdown at 8:00 p.m. for the latest info
    on the head #1 rotation error saga.
    
    Recovered from the crash.  All the carriers were good except for #4.  
    Replaced carrier #4 and all other consumables.  Ran the conditioning and
    breakin with no problems.  Ran 2 boats of wafers and on the last run
    carrier#1 locked up again ran out of time.


                                  NOTICE
                                  ------
     The IO_BKIN recipe on CMP.B1 has been modified. The time in segment #5 
     has been reduced to 20 seconds from 120 seconds. We did this to reduce
     the amount of oxide we were removing from the wafers. We weren't able
     to obtain fresh 50K wafers until 2:30 this afternoon. Please remeber
     to change the time back to 120 seconds before returning the tool to
     manufacturing.

CMP.A2-
    
    Right Spindle Leaving Wafers On Pad:
    -----------------------------------
    The right spindle has been repeatedly leaving wafers on the pad at 
    lift off today. This condition eventually ended in wafer breakage.
    The 2nd o-ring (counting from the center outward) on the right hub
    was replaced. The system is now running MQC's.
    
CMP.B2-

    Wafer Misload:
    -------------
    The system failed to load a wafer on Head #3 this afternoon. We didn't
    see exactly what happened. Its possible that Load Cup #3 may be
    sticking or the lift cylinder might be degrading. We can't get the tool
    at this time to check it out. 

WSTK.1-    Replaced the bellows boot over the unload station dump
           valve.  After assembling the valve with no leaks, the valve did not
           cycle back up to fill the tub.  Located TR2,3 and relay cr17 inside
           the fluids cabinet, under the top lip.  Found that TR2 was not
           opening due to the time delay resistor not making good contact
           inside the spade terminals.  Crimped spade connector and connection
           was reestablished.  Dump valve then started working normally.
63.119C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALFri Aug 30 1996 21:1380
                   CMP Equipment Engeering Passdown for:
                         24-AUG-1996 19:45:24.87

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B1     REPAIR        

================================================================================

CMP.B1-
    
    Head #1 rotation failure problem:
    --------------------------------
    It appears that the problem is with the analog control loop wiring
    for head #1's down force control. We have sucessfully run a full
    cassette of wafers at 377 lbs of down force. (IO_BKIN recipe)
    
    D shift removed and retightened every connection on terminal boards
    14,15, & 16 last night. They also removed and reconnected cable #2
    on the right side lower bulkhead . They sucessfully completed 1/2
    cassette of wafers and passed down to us this morning. We continued
    with a verification run and experienced a head #1 rotation error on
    the fourth run.  
    
    Richie from Speedfam arrived this morning with a new Analog I/O cable
    for cable #2 ( head #1's feedback cable). The cable was run outside
    the tool from the right bulkhead connector to terminal board #16 on
    the Multihead. We have just finished running a full cassette of 
    wafers at 377 lbs. of down force with NO head #1 rotation errors.
    However, head #5 slipped out a wafer near the end of segment 5 and
    it broke under carrier #4. We are now in the process of cleaning up
    and resuming the verification run. We will need to run at least 4
    cassettes of wafers before we're satisfied that we've got resolution
    on this problem.  
    
    This passdown is being sent out early because I'm leaving at 4:00 p.m.
    today. Check out Bradley's passdown at 8:00 p.m. for the latest info
    on the head #1 rotation error saga.
    
    Recovered from the crash.  All the carriers were good except for #4.  
    Replaced carrier #4 and all other consumables.  Ran the conditioning and
    breakin with no problems.  Ran 2 boats of wafers and on the last run
    carrier#1 locked up again ran out of time.


                                  NOTICE
                                  ------
     The IO_BKIN recipe on CMP.B1 has been modified. The time in segment #5 
     has been reduced to 20 seconds from 120 seconds. We did this to reduce
     the amount of oxide we were removing from the wafers. We weren't able
     to obtain fresh 50K wafers until 2:30 this afternoon. Please remeber
     to change the time back to 120 seconds before returning the tool to
     manufacturing.

CMP.A2-
    
    Right Spindle Leaving Wafers On Pad:
    -----------------------------------
    The right spindle has been repeatedly leaving wafers on the pad at 
    lift off today. This condition eventually ended in wafer breakage.
    The 2nd o-ring (counting from the center outward) on the right hub
    was replaced. The system is now running MQC's.
    
CMP.B2-

    Wafer Misload:
    -------------
    The system failed to load a wafer on Head #3 this afternoon. We didn't
    see exactly what happened. Its possible that Load Cup #3 may be
    sticking or the lift cylinder might be degrading. We can't get the tool
    at this time to check it out. 

WSTK.1-    Replaced the bellows boot over the unload station dump
           valve.  After assembling the valve with no leaks, the valve did not
           cycle back up to fill the tub.  Located TR2,3 and relay cr17 inside
           the fluids cabinet, under the top lip.  Found that TR2 was not
           opening due to the time delay resistor not making good contact
           inside the spade terminals.  Crimped spade connector and connection
           was reestablished.  Dump valve then started working normally.
63.120C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Aug 31 1996 20:4027
                   CMP Equipment Engeering Passdown for:
                         31-AUG-1996 19:37:26.61

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP.B2     PM            


			CMP.C1's Hit List Update
	                ------------------------

			1. Load alignments 
             ok         2. Unload alignments.                       
	     ok   	3. Chillers filled
             ok         4. Check if platens come up to temperature
    needs to be checked 5. Repair the final wetting ring
		        6. Arm alignments

CMP.C1 - The final platen was not heating.  The chiller had a low glycol level 
	 and the indicator lamp was burned out.  The bulb was replaced and the
	 chiller topped off.  Platen heated with out a problem.  The upgraded
	 shuttle jam sensor was installed but there was not enough time to
	 properly adjust it.  The water track to cassette alignment was also
	 completed.  Tool sets still needing the load handler and arm 
	 alignments.  Mike Standing and Myself will be in on Tuesday to do
	 them.	Tool power and DI is off.
63.121C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Sep 07 1996 20:1820
                   CMP Equipment Engeering Passdown for:
                          7-SEP-1996 19:17:31.48

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

================================================================================

EQUIPMENT HIGHLIGHTS:

CMP.A1 - Down for poor uniformity.  Replaced the pad.  

CMP.A2 - Down for slipping wafers from the right carrier on every lift off.  
	 replaced the carrier plate O-ring and ran 6 wafers with no further 
	 problems. 


CMP.B2 - Weekly PM is in the incomplete note file.
63.122CMP PDSTRATA::TDYERThu Sep 19 1996 18:5068
 
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: September 9th, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASS DOWN
-----------------------------------------------------------------------------

cmp.b2 - Dump valves modified to pressures close.

cmp.b3 - Several inverter errors, see John S. note entry.

CMP.B1 - Vibration problem:
 Created 3 recipes, vib_1 (step7=300), vib-2 (step7=313) and vib-3
(step-7=330). Ran 5 wafers on each recipe results were:
	vib-1 = vibrated in step 7 head4
	vib-2 = no vibration
        vib-3 = no vibration

 Notice all offset were the same except head-4, decide DF on 4 may be out.
 Calibrated DF on all 5 heads, head4 WAS out by ~20lbs.

 Ran the following:
	vib-1=vibration head2
	vib-2=vibration head1
	vib-1=vibration head3
 Created an MQC recipe "270_mqc" with 270lbs of  DF in the clean step, step-7.
 NO vibrations, particle were:   tot	lrg	~scrL
				425	79	.2
				220	70	.24
				249	79	.9
				274	58	.6
				292	60	.4
Create a MQC recipe with 250lbs of DF in clean step, particles were:
                                tot	lrg	~scrL
				425	79	.2
				220	70	.24
				249	79	.9
				274	58	.6
				292	60	.4
Repeated the 250lb test results were:
				413	112	0
				290	90	0
				341	109	0
				204	70	0
				406	97	0
Repeated the 250lb test again results were:
				362	91	0
				294	66	0
				330	82	0
				441	71	0
				291	84	0

No hardware discrepancies were found. The table and or carrier shaft bearings
on this older tool may be wearing down and make the tool more susceptible to
vibration. DF in step-7 will be lowered to 250lbs in In ALL recipes with a 
313lb STEP7. We will continue to monitor and research the problem in conjunction
with the head-1 rotation problem.

63.123C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Sep 21 1996 20:4734
                   CMP Equipment Engeering Passdown for:
                         21-SEP-1996 19:42:57.86

	 CMP Down Equipment listing for Fab6
         ====================================
 
CMP-SCRUB. REPAIR        
CMP.A2     UNSCHED_DOWN  
CMP.A1 - Down for problems w/ the conditioner.  Tool never came up from
	 yesterday when the conditioners's end effector fell off.  After 
	 putting the arm back together there was excessive play in the C.arm
	 while Oscillating.  Previous shift suspected that the shaft was bent.
	 The shaft did'nt appear bent to me so I cleaned everything and put new
         split pins in and reassembled the arm.  Cycled the conditioner about
	 30-40 times in all w/ no problems.  Put the old brushes and carriers
	 back on the tool w/ a new pad.  Conditioned and broke in the pad.  The 
	 tool sets needing only MQCs.

CMP.A2 - Down for heads not lifting off the table.  Never had time to touch it.
	 
CMP.B1 - Down for robot errors.  The robot kept deservoing.  Tried move robot 
	 on the cal screen.  Tried reseting the robot controller w/ no luck.  
	 Powered the tool down for a few minutes and checked the cables, 
	 Everything seemed alright.  Powered it back up and had no more 
	 troubles.

SCRUB1 - Down for a loud Squeak in the OB, OB upper motor errors and the wafer
	 riding over the top of the rollers in the OB station.  Found the
	 Squeak to be coming from the back roller took the shaft apart and 
	 cleaned and adjusted belt tension.  The roller heights and motor issue
	 still needs to be addressed.  Ran out of time. 

	FYI - Slurry to the whole room was lost for about an hour today.

63.124CMP PDSTRATA::TDYERMon Sep 30 1996 20:2468
 
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
    +---+---+---+---+---+---+tm-+
         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: September 9th, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASS DOWN
-----------------------------------------------------------------------------

cmp.b2 - Dump valves modified to pressures close.

cmp.b3 - Several inverter errors, see John S. note entry.

CMP.B1 - Vibration problem:
 Created 3 recipes, vib_1 (step7=300), vib-2 (step7=313) and vib-3
(step-7=330). Ran 5 wafers on each recipe results were:
	vib-1 = vibrated in step 7 head4
	vib-2 = no vibration
        vib-3 = no vibration

 Notice all offset were the same except head-4, decide DF on 4 may be out.
 Calibrated DF on all 5 heads, head4 WAS out by ~20lbs.

 Ran the following:
	vib-1=vibration head2
	vib-2=vibration head1
	vib-1=vibration head3
 Created an MQC recipe "270_mqc" with 270lbs of  DF in the clean step, step-7.
 NO vibrations, particle were:   tot	lrg	~scrL
				425	79	.2
				220	70	.24
				249	79	.9
				274	58	.6
				292	60	.4
Create a MQC recipe with 250lbs of DF in clean step, particles were:
                                tot	lrg	~scrL
				425	79	.2
				220	70	.24
				249	79	.9
				274	58	.6
				292	60	.4
Repeated the 250lb test results were:
				413	112	0
				290	90	0
				341	109	0
				204	70	0
				406	97	0
Repeated the 250lb test again results were:
				362	91	0
				294	66	0
				330	82	0
				441	71	0
				291	84	0

No hardware discrepancies were found. The table and or carrier shaft bearings
on this older tool may be wearing down and make the tool more susceptible to
vibration. DF in step-7 will be lowered to 250lbs in In ALL recipes with a 
313lb STEP7. We will continue to monitor and research the problem in conjunction
with the head-1 rotation problem.

63.125CMP PDSTRATA::TDYERTue Oct 01 1996 17:5129
 
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 1st, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASS DOWN
-----------------------------------------------------------------------------

WSTK.2 - waiting on parts.

CMP.B1 - Down for reoccurring rotation failure problems. the following game plan
         is in progress with DEC and SF:
         1) Calibrate all DF fairchilds
	 2) Calibrate DF with BOTH cal meters, note discrepancies, use the
            new meter for final set up.
	 3) Run test wafers
	 4) Replace head-1 rotation gear box.
	 5) Run test wafers
	 6) Clean tool, replace pad, log to verify.
            
63.126CMP PDSTRATA::TDYERWed Oct 02 1996 10:1127
 
    +---+---+---+---+---+---+---+
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 2ND, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP.B1 VIBRATION/CRASH ACTION PLAN. 
-----------------------------------------------------------------------------

 CMP.B1 - REOCCURRING CRASHES DUE TO EXCESSIVE FRICTION/VIBRATION.
        1) Replace slurry pump-1 (#2 already replaced)
        2) Inspect slurry lines for restrictions
        3) Calibrate DF on all heads.
        4) Break i pad, than begin 100W test. Use recipe VIB_TEST,
           *** Make sure you have GOOD OXIDE wafers ****
        If NO vibration occurs, return to MFG. IF ANY vibration occurs, page 
        me immediately.

  
63.127CMP PDSTRATA::TDYERWed Oct 02 1996 20:0852
 
    +---+---+---+---+---+---+---+
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 2ND, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 WSTK.1 -Down for RPC-II problems.
         A new EPRV was installed today in in the DF slot. The arm is still
	 functioning properly. There appears to be a zero cal stored in the
         software which can NOT be reset, also the other prev appears to be 
         bad.
         WSTK field service will be here at 8:00am, they have access to reset
         the zero cal and will bring an other eprv with them.
         also on order gxl-h81 pv660010

 CMP.B1 - REOCCURRING CRASHES DUE TO EXCESSIVE FRICTION/VIBRATION.
  done  1) Replace slurry pump-1 (#2 already replaced)
  done  2) Inspect slurry lines for restrictions
  done  3) Calibrate DF on all heads.
  done  4) Check/calibrate ALL wafer loss sensors with a scraped product wafer.
  done  5) Break in pad, than begin 100W test. Use recipe VIB_TEST,
           *** Make sure you have GOOD OXIDE wafers ****
        - Monitor DF on screen, note any over shoot
          - Watch all heads closely
          - Monitor IM on infranor for head-1 
        If NO vibration occurs, return to MFG. IF ANY vibration occurs, page 
        me immediately.

  We had solved a vibration problem on the Speedfam tools in 11/95. This
  problem was caused by ramping the table and carrier oscillation at the
  same time. One possibility is that the table has not completed it's ramp up
  in step-4. We extended step-4 by 4 seconds in the VIB_TEST recipe. We also
  noticed that in step-5 there is a ramp rate by we are NOT ramping pressure.
  If this runs 100 wafers OK, calibrate the table ramp rates. Have your
  supervisor and or security, REMOVE our TACHOMETER from the cal lab. Use this
  to check and monitor the table speed.  Call me after the 100 wafer test.

  *** PLEASE, PLEASE PLEASE MAKE SURE THERE IS OXIDE ON THE WAFERS ***
  *** SUPERVISORS, PLEASE HELP US WITH WAFERS, WE ARE RUNNING LOW***

  
63.128CMP PDSTRATA::TDYERThu Oct 03 1996 19:4860
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 3rd, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 WSTK.2 -In MQC. RPC-2 was repaired earlier by IPEC FS. During MQCs the down
	 sensor drifted. Since the conditioner did not know that it was down, 
         it cut off the down force. The sensor was adjusted, tested and MQC 
         are in progress. Should there be a problem with MQC or RPC-II, 
         give me call.

 CMP.B1 - REOCCURRING CRASHES DUE TO EXCESSIVE FRICTION/VIBRATION.
        * THERE HAS BEEN TWO DIFFERENT VIBRATION/CRASH PROBLEMS
	1) VIBRATION AND CRASHES DURING THE MAIN POLISH STEP, STEP-5
	2) VIBRATION AND CRASHES DURING THE RINSE STEPS-6,7
	There has been NO vibration in STEP-5 since the fairchilds and DF was
        calibrated, however vibration continued in step6. We speculated that
	the water was causing vibrations on B1, but why not on B2 or B3?
        In STEP-6 B2 and B3 take approximately 5 seconds longer to purge the 
        slurry off the table than does B1. We determined that tube between the
        rinse/slurry valve and the end of the dispense tube on B1 is ~5', on 
        B2 and B3 it's ~15',3 times longer. This causes a much faster slurry 
        to water transition on B1. Step-6 on B1 has been decrease to 
        compensate for the hardware difference (shorter line). Initial 35w test 
        look good. Particles look good all totals are ~600.

     PLAN FOR TONIGHT:
        1) Run 50 more wafers through no_crash, if OK go to step-2
        2) Replace pad, clean tool and put system UP, then to MQC,
        3) Breakin pad, check MQCs,  if OK start product.

 FAB6 SLURRY PASSDOWN FROM KYLE:

     A new batch of slurry (lot #2h-16-96-1) was manually pumped to 
CMP.A2 due to the problems we are currently having with low rates.
The results were:
                 head 1-1300
                 head 2-1115
Directly after this, the slurry from the day tank was hooked back up 
and the results were as follows:
                head 1-1132
                head 2-1054
Based on the above, I have asked Ashland Chemical to dump the current 
day tank and replenish the slurry with the new batch.  We should have 
new slurry by 6pm or 7pm tonight.  The change over should be transparent
to operations.  Unfortunately, there is only enough slurry of this 
batch to tide us over through the weekend.  Then a new batch will have 
to come on line.
                   - Kyle   
63.129CMP PDSTRATA::TDYERFri Oct 04 1996 18:0460
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 4th, 1996
     cc: Jim Scott	                       From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
         Weekly.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 WSTK.2 -UP.

 CMP.B1 - THE REOCCURRING CRASHES DUE TO EXCESSIVE VIBRATION HAS BEEN FIXED,
	  NOW IT'S TIME TO MOVE ON TO THE HEAD-1 STALLING PROBLEM.

          TESTING CONDUCTED TODAY: 
          1) Connected a chart recorder to the input of the down force EPRVs.
          2) Connected multi meter head-1 infranor and monitored the Im (motor
             current)
          3) Monitored actual down force displayed on the screen

          FINDINGS:
          1) Head-1 EPRV has a higher voltage input for a longer period of
	     time. This means that the EPRV will put out higher pressure to
	     head-1 for a longer period of time. 
          2) IM on head-1 spikes up to 4-5v, the other heads are closer to 2v.
             We can conclude that the EPRV is working, it is sending out higher
             pressure to head-1 and is causing the motor to pull more current.
          3) The actual DF displayed for head-1 shoots up to ~450lbs, and
	     slowly drops to 377. The other heads overshoot much less and 
             return to set point much quicker. Head-5 constantly goes to 380,
             than with in seconds drops to set point of 377, it runs flat line
             for the entire polish,,,,,,,a model head!
    
          Analog out put PCB has been replaced. Head-1 IM is still high around
          5v, the EPRV is intermittently spiking to, actual DF on the screen 
          for head-1 is spiking upto ~415lbs. We witnessed a stall on all 5
	  heads all PRV signals spiked high.

          Held a conference call with SF Phoenix, presented above findings.
	  QUOTES FROM SPEEDFAM PHOENIX: "OH YEH, HEAD-5 DOES RUN BETTER THAN
          1-4. WE DISCOVERED THIS SOFTWARE BUG SEVERAL WEEKS AGO, WE HAVE A
          FIX. WE CAN STOP THE OVER SHOOTING ON ALL HEADS AND HAVE THEM RUN
	  LIKE HEAD 5. THERE IS AN ERROR IN THE CODING FOR HEADS 1-4."

         So, what do we do. After checking one last item, head down sensors,
         the tool will be released to MFG with a warning. Should the head stall
	 at touch down, the recipe will need to be restarted. If it errors mid
         polish, record time, unload, make recipe with remaining time. 
         On Tuesday we will upgrade the software and test the system.




63.130CMP PDSTRATA::TDYERFri Oct 18 1996 18:0036
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 18th, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------
 
 The BAG filtration unit is running if there are any problems contact ASHLAN
 Chemical, they will replace the bag with an other 10u bag.
 
 CMP.B1 - Head-1 rebuild is complete, the DF is being calibrated at this time.
          Once Speedfam and Digital Techs are satisfied with the integrity of
	  the polisher a 100W marathon will be run at 400lbs of DF for 30seconds
          in step 5.
          Call me at the start and Finish of the marathon, I will RELEASE the
          system from home.   (508-699-4905) OR PAGED (508-387-1389).
  
  ** REMINDER FOR SUPERVISORS **
     
     IF THE SPEEDFAMS ARE DOWN FOR >4 HOURS, SPEEDFAM IS TO BE PAGED AT
     THE 24h RESPONSE LINE # 800-276-9149, THEY WILL CONTACT OUR REPS.
     AND SUPPORT WILL BE VIA PHONE.
     Onsite coverage after 8pm can only be authorized by the supervisors.
     If Speedfam works past 8pm or on weekends on their own behalf or to finish
     up on existing problems, it will not be billable.

  
63.131CMP PDSTRATA::TDYERMon Oct 21 1996 19:3329
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 21st, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 CMP.B1 - Still down for head-1 work. All analog input values were showing max
          at 4095. Problem isolated to chiller channel. Head-1 work continues.
        - Speedfam will have 5 reps here tomorrow and go into shift work.

 CMP.B3 - High particles. The 10u bag filter was replaced with a 5u filter,
          still high particles. The osmonic filter was put on line. Particles
	  were tested on the ENG_MQC recipe with the osmonic filter online for
          45min. This test also failed. Bag filter put back on line @5u. 
          Particle test will be repeated with the standard MQC recipe and the
          ENG2_MQC recipe. If the ENG2_MQC passes and the standard fails, all
          recipes will require 2 seconds added to step-6. Should this not pass,
          try a local 5u catridge filter.

63.132CMP PDSTRATA::TDYERTue Oct 22 1996 19:1041
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 22nd, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 WSTK.2 - SHUT DOWN FOR PROCESS/SPEED ISSUES.

 CMP.B1 - SEE BRENDENS UPDATE.


 HIGH PARTICLES ON ALL CMP TOOLS SUMMARY/UPDATE:

 Task/test                                           results

 - Switch from  10u to 5u bag filter.......................bad
 - Switched back to osminic filter ....................... bad
 - Switch back to 5u bag + extended rinse step.............bad
 - Dump and rinsed day tank, refilled with 2I-1796-16......bad
 - Installed local filters.................................bad
 - Tested lot 2I-1796-22 locally on A1.....................good
 - Tested lot 2I-1796-16 locally on A1......................good
 - Flushed complete slurry system, filled with -22.........good
 
 All tools passed particles, we need to retry -16 lot, in a controlled manner,
 on the bulk system. Based on the data it appears the BULK system itself was
 contaminated. A WEEKLY flush may be necessary. A 4 hour a week shut down
 is easier to deal with than 2 days of troubleshooting followed by a 4 hour
 shut down? This is the 2 time we have been forced to flush the slurry system
 for particles in the last 6 weeks. A discussion with Ashlan and MFG will held.

63.133CMP PDSTRATA::TDYERWed Oct 23 1996 20:0351
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 23rd, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 CMP.B1 - SEE BRENDENS UPDATE. (motor due in 11pm, will need 200 wafer 
                                marathon @400lbs)

 HIGH PARTICLES ON CMP.B TOOLS SUMMARY/UPDATE:

 The A tools passed well below the ucl. We focused today on the cleaning steps
on the B tools. B3 crashed while attempting a 21sec 337lb step 6. The final 
process which ran with out vibration and passed particles on B2 was as follows:

	step 1-5 NO CHANGE
	step-6    377df,  19sec, water, no osc=11.5/11.5
	step-7	  277df,  30sec, water, no osc=11.5/11.5
	step-8	  20df,  13sec, water, no osc=11.5/11.5
	step-9	  20df,  7sec, water, no osc=11.5/11.5
	step-10	  lift off no osc=11.5/11.5

results repeated, last counts were:
head-1 lrg   total sct
       189   614    0
       181   621    0
       177   601    0
       166   539    0
       169   559    0
  
 Plan:
 1) match B3's MQC recipe to B2, check mqcs.
 2) check uniformity on B2,,,,,was not checked today.
 3) Change step6-10 on B2 and B3 for the following recipes:
		all ILD recipes
                    TUP_A 
                 .  TUP_b 
                 .  TUP_c 
                 .  TUP_d 
                 .  TUP_e 
                 .  TUP_f 
63.134CMP PDSTRATA::TDYERWed Oct 23 1996 20:1471
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: October 23rd, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------

 WSTk.1 - still shut down.....

 CMP.B1 - SEE BRENDENS UPDATE. (motor due in 11pm, will need 200 wafer 
                                marathon @400lbs)

 HIGH PARTICLES ON CMP.B TOOLS SUMMARY/UPDATE:

 ** added section, details on the B tools **
 Our standard mqc recipe uses a 10 second rinse step-6 with DI water. Only
 the last 2 seconds have full water on the table. We timed the transition today
 and found it to be 17 seconds. This lead us to the experiments around increase
 rinse time. After finding a step that would not vibrate, we still had particle
 levels close to the ucl. A center lift off was combined with an extended
 step-6.
 The change in transition time from 6 to 17 seconds is not fully understood.
 The slurry tubes were replace don B2 and B3 last week. Although the tubes appear
 the same, the new style tubes have a very thin Teflon lining on the id of the
 tubbing?@#$@#%....
 Now that the B tools are performing like the A tools for particle counts,
 should there be a slurry issues, both system should fail on the same day,
 making trouble shooting easier. If slurry does go adrift, the plan is to 
 perform a KoH extended purge, and start up on the osminic filter.

 ****

 The A tools passed well below the ucl. We focused today on the cleaning steps
on the B tools. B3 crashed while attempting a 21sec 337lb step 6. The final 
process which ran with out vibration and passed particles on B2 was as follows:

	step 1-5 NO CHANGE
	step-6    377df,  19sec, water, no osc=11.5/11.5
	step-7	  277df,  30sec, water, no osc=11.5/11.5
	step-8	  20df,  13sec, water, no osc=11.5/11.5
	step-9	  20df,  7sec, water, no osc=11.5/11.5
	step-10	  lift off no osc=11.5/11.5

results repeated, last counts were:
head-1 lrg   total sct
       189   614    0
       181   621    0
       177   601    0
       166   539    0
       169   559    0
  
 Plan:
 1) match B3's MQC recipe to B2, check mqcs.
 2) check uniformity on B2,,,,,was not checked today.
 3) Change step6-10 on B2 and B3 for the following recipes:
		all ILD recipes
                    TUP_A 
                 .  TUP_b 
                 .  TUP_c 
                 .  TUP_d 
                 .  TUP_e 
                 .  TUP_f 
63.135C SHIFT CMP PASSDOWNFABSIX::B_WESTPHALSat Oct 26 1996 20:4540
                   CMP Equipment Engeering Passdown for:
                         26-OCT-1996 19:43:26.30

	 CMP Down Equipment listing for Fab6
         ====================================
 
No Equipment Down

CMP.B1 - Down for "ROTATION OUT OF TOLERANCE" errors and some voltage readings 
	 that needed to be taken by SFAM.  Rep in formed me that the error
	 response time needed to be adjusted temporarily to correct the error
	 problem.  John H. & Rich B. hooked up an O-scope and a Dranetz 
	 analyzer to the power in on various carrier rotation motors.  Tool was
	 put to END_REPAIR.


CMP.B3 - Down for head to head removal being out (head 2).  Swapped the carrier
	 and process rechecked the MQCs.  They failed.  The DF was checked.  
	 The EP regulators and DF were adjusted for each head.  

                            PRE        POST
                            381.5      377.2           
                            371.9      377.2
                            373.1      377.8
                            369.9      376.9
                            371.2      377.0

         The tool was set to verify-U to have the MQCs rechecked.  The MQCs 
	 passed so the repair was ended.

   *Note - Slurry system was shut down for the filter change at 4pm this
afternoon.  The next filter change is now scheduled at 8:30am tomorrow (per
Ashland).  We were also notified that they are out of Ossmonics filters as of 
8:30am tomorrow.

  **Note - Slurry sensors for the B tools were checked to verify proper
operation as requested by Process Engineering.

 ***Note - All pm completed.

63.136CMP PDSTRATA::TDYERMon Nov 04 1996 16:1528
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: November 4th, 1996
     cc: 	                               From: Timothy P. Dyer
         		       		       Dept: Equipment Engineering
       CMP.dis           	               Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
  CMP PASSDOWN 
-----------------------------------------------------------------------------
     
 CMP.B1 - False rotation alarms continued through out the day. The software
          is being switched over to 493c, with head-1 and 3 irms @ 14v and
          intv loop at 75. If head-1 fails during testing, we will be forced
          to live with 494-dec. Please move the entire 494d directory and
	  rename, save all recipes. Move 493cc back into the Speedfam
	  directory, and all it's recipes. Test breakin-1,2,3, IO_MQC and
          ild-1 recipes with oxide wafers. Make sure step-6 time coincides with 
          1-2 seconds of water at the very end of step-6.



63.137CMP PDSTRATA::TDYERFri Nov 15 1996 15:2632
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: November 15th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
CMP PASSDOWN
-----------------------------------------------------------------------------
            
 CMP.B1 - up
 CMP.B2 - down. Investigate head-5 alignment drift problem.  Plan:
        1 Replace infranor................motor still shakes
	2 Replace DCX dughter pcb.........
	3 Replace DCX mother pcb..........
	4 Replace osc motor (do not go to this step with out contacting me)

	Between each step, cycle head-5 in and out several times, move the
	multi-head, trip the door interlocks, and VERIFY head-5 load cup 
        alignment. Do this 10-15 times, if it is repeatable, put the system
        up, if it is not continue with next step.   
        If there are any slid outs from head-5, proceed to next step.

 CMP.B3 - up.
 
63.138CMP PDSTRATA::TDYERMon Nov 25 1996 16:1826
    +---+---+---+---+---+---+---+
    | d | i | g | i | t | a | l |	  
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: November 25th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
CMP PASSDOWN
-----------------------------------------------------------------------------
            
 CMP.B1 - verify. Monitors crashed due to head-3 stall.
 CMP.B2 - up
 CMP.B3 - up. Slurry-3 reconnected, DI water is flowing to 2nd table.

 Osmonic filters remove today and the FILTER-RITE was installed. Ashlan will
 monitor pressure and we will monitor particle. Should either fail, the 
 Osmonic will be put back on line.


63.139Updated EEG passdown, change to CMP.B1FABSIX::R_GEEMon Nov 25 1996 19:0637
              <<< ASDG::DISK$SYS_DATA:[NOTES$LIBRARY]CMP.NOTE;1 >>>
                                    -< CMP >-
================================================================================
Note 63.138                     EEG CMP DAILY PD                      138 of 138
STRATA::TDYER                                        26 lines  25-NOV-1996 16:18
                                  -< CMP PD >-
--------------------------------------------------------------------------------

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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: November 25th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
CMP PASSDOWN
-----------------------------------------------------------------------------
            
 CMP.B1 - up.     Monitors crashed due to head-3 stall. 

	NOTE: 	  If head #3 stalls again, take it off-line and run 
		  another set of MQC's using 4 heads only. Head #3 
		  will stay off-line until further notice, per Engineering.
 CMP.B2 - up
 CMP.B3 - up. Slurry-3 reconnected, DI water is flowing to 2nd table.

 Osmonic filters remove today and the FILTER-RITE was installed. Ashlan will
 monitor pressure and we will monitor particle. Should either fail, the 
 Osmonic will be put back on line.


63.140CMP PDSTRATA::TDYERTue Nov 26 1996 15:5839
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					I N T E R O F F I C E   M E M O
 
     To: Dennis Goodwin			       Date: November 25th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
CMP PASSDOWN
-----------------------------------------------------------------------------

          HAPPY THANKSGIVEN TO ALL, EAT WELL AND RELAX AS THE COWBOYS
	  KICK SOME BUTT!
            
 CMP.B1 - UP. Modified motor tested in head-3, the motor failed, original
          was re-installed.
          IF HEAD-3 HAS ANY INSTANCES OF ROTATION STALLING, TAKE HEAD-3 OFF
  	  LINE AND RE-MQC WITH 4 HEADS AND RELEASE TO MFG. WE DO NOT WANT TO
	  RISK BREAKING PRODUCT WAFERS.
 CMP.B2 - up
 CMP.B3 - up.

 FILTER-RITE is still running on slurry loop. Ashlan will continue to monitor 
 pressure and we will monitor particle. Should either fail, the  Osmonic will 
 be put back on line. If particles fail on one SPEEDFAM polisher, verify tool
 is clean and check a 2nd SPEEDFAM polisher for particle levels. Should a 2nd
 tool fail, the slurry is confirmed as the source. Contact Engineering (Jim T
 will be here 11/27, I can be reached 11/29-12/1 at home or pager) and contact
 Ashlan and request the y put the Osminics back on line. Enter time/date, 
 problem, ie pressure, clog or particles in notes file.

 I WILL NOT BE IN TOMMOROW 11/27, PLEASE SEE JIM TOOKER FOR ANY ISSUES.

63.141CMP PDSTRATA::TDYERWed Dec 04 1996 18:0534
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					I N T E R O F F I C E   M E M O
 
     To: cmp.DIS			       Date: December 4th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP.PD
-----------------------------------------------------------------------------
                
cmp.b1 - Verify. wafer detect tripped erroneously. A shift calibrated same.

cmp.b2 - up

cmp.b3 - THE MAIN MOTOR REPLACEMENT JOB IS COMPLETED AND ACCEPTED. 
	 Belt tension, alignment, runout all look good, the motor and belts
         were quiet under full load conditions. During the mini-marathon,
         we noticed slurry-2 intermittently turned off. Once slurry-2 is up
         and verified working CMP.B3 can be released to MFG for MQCs and
         product if everything comes in spec. EEG monitor underside of polisher
	 for any leaks, strange noises, etc.

 SLURRY - The milipore filter is online in the basement. Should particles
          fail on more than one Speedfam or the filter clog, switch over
          to the osmonics filter.


63.142CMP PDSTRATA::TDYERFri Dec 20 1996 13:5238
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					I N T E R O F F I C E   M E M O
 
     To:Dennis Goodwin			       Date: December 20th, 1996
     cc: cmp.dis	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP.PD
-----------------------------------------------------------------------------
                
cmp.b1 - UP. If head 2,4,5 stall, please note the actual down force on the
	     screen. If you did not witness the stall load some oxide dummies.
	     and run the and watch the actual DF on the screen, RECORD ALL
	     OBSERVATIONS IN THE NOTES FILE. If there is excessive overshoot, 
             >450lbs, page Speedfam. They will need to determine why B1 is 
             overshooting more than B2,3. If the df does no spike high, 
             replace the infranors for the stalling heads, set IRMs to 12.5V 
             and test the tool at 425 lbs of DF with 50 wafers.

cmp.b2 - up

cmp.b3 - Down - 2nd table drive failed, lower shaft bearings failed and are
	        being replaced. 
	Speedfam is leading this project, please work with them, they will be
	in close contact with Phoenix. A couple specific instructions:
	1) JP will manually tap the 6 bolt holes in the 2nd table.
	2) Speedfam will locate the alignment procedure and align the 2nd table
	   drive shaft assembly prior to running any test wafers.
	3) Speedfam will get the belt tension specification and set the
	   correct belt tensions prior to running any wafers.
	4) Give me a call or page if there are any complications and prior to 
	   release.
63.143CMP PDSTRATA::TDYERFri Jan 03 1997 17:0437
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: FAB6 CMP			       Date: January 3rd, 1997
     cc: Dennis Goodwin	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP PASSDOWN
-----------------------------------------------------------------------------
 CMP.B1,2,3 - OEM vacuum filters to be installed, and gauge put on BOTH sides
	      of element for DP readings. The filters from SR-94 have changed,
	      for reasons unknown and are clogging in 1-2 days. 
          
 CMP.B2  - 8 wafers from lot xd0590 broke/scratched on 2nd table. The ONLY
	   time we have experienced crashes on 2nd table is when an out of
	   pocket condition occurs during the lift off from the 1st table.  
           Test this theory by stopping the polisher immediately after lift
	   off from the primary table. Inspect all wafers for out of pocket
	   conditions. If they are in fact out, the vacuum must be improved or
	   the surface tension reduced.
	   DEC and SF reps will work to isolate a potential low vacuum problem.
	   The collapsing tubing in the multihead will be replaced, the vacuum
	   filter replaced and the pump rebuilt.  This should improve the 
	   vacuum at the carriers to ~25". If vacuum is in spec and wafers
	   continue to come out of pocket, change the last two step of the
	   recipes to 12.9 (from 12.7) and retest. If wafers remain in pocket,
	   check MQCs. If MQCs pass run marathon.
	
  INCLUDING BREAKIN AND MQC WAFERS, CMP.B2 IS TO RUN A 100 WAFER MARATHON 
  BEFORE RELEASING TO MFG. THIS SYSTEM HAS BROKEN 12 PRODUCT WAFERS IN 4 DAYS 
  ANY QUESTIONS, GIVE ME A CALL.
63.144CMP PDSTRATA::TDYERFri Jan 17 1997 16:1950
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: FAB6 CMP			       Date: January 17th, 1997
     cc: Dennis Goodwin	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP PASSDOWN
-----------------------------------------------------------------------------
		**** I no longer have a long range pager ****

 CMP.B1,2,3 - No issues. If head stalls occur on B1, document every possible
	      detail and give me a call 

 CMP.B4  - Mechanical acceptance testing will be run this weekend with a
	   barrels connected locally to each slurry channel. Once Speedfam 
	   has completed their testing and set up, they will inform  Brian J. 
           and he will start the marathon. The following test and recipes 
	   will be run.
           
    			wafers	recipe
                	5	bin-1
			5	bin-2
			5	bin-3
			5	breakin
			5	IO_MQC
			5	IO_MQC
 pre-read 5 12k  --->	5	IO_MQC     post read and record, continue....
			5	MECH_400   (400lbs)
			5	MECH_400   (400lbs)
			5	MECH_400   (400lbs)
			450	MECH_30    (313lbs, 30 seconds)
	              ------
		TOTAL =	500

	* TWO ASSIST ARE ALLOWED IN THE 500 WAFER MARATHON, IF A FAILURE
	  OCCURS, RE-START THE MARATHON AND CALL ME.

	* PLEAS SEE BRIAN J. FOR MARATHON STATUS PASSDOWN, ONE DIGITAL
	  TECHNICIAN IS TO BE PRESENT DURING TEST.
 
    (home phone 508 699-4905)
	 
    
63.145CMP PDYIELD::TDYERTue Feb 18 1997 16:3827
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: FAB6 CMP			       Date: 2/18/97
     cc: Dennis Goodwin	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP PASSDOWN
-----------------------------------------------------------------------------
		**** I no longer have a long range pager ****

 CMP.B1,2,3,4 - No issues.


 CMP.A2 - Down for platen sweep out od spec at .060". Strasbaugh does have 
	  anyone available today. This system is having a difficult time because
	  the frame supporting the gear box was damaged when the polisher was 
	  dropped  through the floor 2 years ago. Remove bolts and rebolt
 	  transmission, re-check sweep. Bolt holes or bolt may require rework to 
	  increase available adjustment distance.

63.146CMP PDYIELD::TDYERWed Feb 19 1997 16:5433
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: FAB6 CMP			       Date: 2/19/97
     cc: Dennis Goodwin	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP PASSDOWN
-----------------------------------------------------------------------------
		**** I no longer have a long range pager ****

 CMP.B1 - Crash. It appears 1 wafer broke into very very small pieces during
 	  one of the polish steps. The pieces were too small to be detected by
	  the wafer loss sensors. The tool continued to polish with the wafer
	  chips on the pad, these chips totally scratched the 3 remaining 
	  product wafers. When the polisher attempted pad lift off, it errored
	  for vacuum. Speedfam reps cleaning up tools, replacing carriers, 
	  pads and investigating possible cause.

 CMP.B,2,3,4 - No issues.

 CMP.A2 - Down for platen sweep out of spec at .060". The 1st 5/8" of the 
	  6 bolts have been turned down to the minor ID of the threads. This
	  allow more lateral adjustment. JP and JS are bolting transmission back
	  in at this time. Sweep will be set to +/- .001" front to back and
	  leveled side to side with precision machinist level. Spindle will
	  need realignment.
63.147CMP PDYIELD::TDYERFri Feb 21 1997 16:4433
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         (semiconductor)  
					I N T E R O F F I C E   M E M O
 
     To: FAB6 CMP			       Date: 2/21/97
     cc: Dennis Goodwin	                       From: Timothy P. Dyer
         		       	       	       Dept: Equipment Engineering
                   	       		       Ext:  5072  
                                               Node: SCOMAN::TDyer
         				       Lock/Mail Stop: HLO1-1/p-11
-----------------------------------------------------------------------------
 CMP PASSDOWN
-----------------------------------------------------------------------------
		**** I no longer have a long range pager ****

 CMP.D1-7 - System has arrived in tack and is being stored in the passthrough
	    until Monday when it will be placed on the pedestals.
 
 CMP.C1-7 - Slurry pump lines ruptured twice on sc-112 lines, filter may be
	    clog or TOO small u rating. BW is on it.

 CMP.B1 - Crash. The root cause of the last two crashes was due to a bad slurry
	  pump, ie reduced slurry flow. Additionally, wafer detect was disabled
	  for reasons unknown, it has been turned back on. 

 CMP.B4 - The slurry to B4 from the MEGA system has been turned on. There are 
	  still some minor problems with the mix unit and dosimeter. We do not 
	  have confidence in the current batches and will wait until the issues 
	  are resolved on Monday before starting process qual.